Application of a single-reflection collimating multilayer optic for X-ray diffraction experiments employing parallel-beam geometry

Journal of Applied Crystallography

Volumn 41, Issue 1, 2008, Pages 124-133

  Wohlschlagel M ^a   Schulli T U ^b   Lantz, B ^b   Welzel, U ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b Xenocs SA   (France)

Author keywords

Parallel beam; Primary optics; X ray mirror

Indexed keywords

EID: 38349164773     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889807050005     Document Type: Article

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