Calculation of the instrumental function in X-ray powder diffraction

Journal of Applied Crystallography

Volumn 39, Issue 3, 2006, Pages 304-314

  Zuev, A D ^a  

^a NONE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33744459993     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889806005693     Document Type: Article

References (28)

1. Alexander, L. (1954). J. Appl. Phys. 25, 155-161.
2. Authier, A., Lagomarsino, S. & Tanner, B. K. (1996). Editors. X-ray and Neutron Dynamical Diffraction: Theory and Applications, NATO Science Series B, Vol. 357. New York: Plenum Press.
3. Balzar, D., Audebrand, N., Daymond, M., Fitch, A., Hewat, A., Langford, J., Bail, A. L., Louë r,D.,Masson, O.,McCowan, C., Popa, N., Stephens, P. & Toby, B. (2004). J. Appl. Cryst. 37, 911-924.
4. Bergmann, J., Friedel, P. & Kleeberg, R. (1998a). CPD Newsl. 20, 5-8.
5. Bergmann, J., Friedel, P. & Kleeberg, R. (1998b). http://www.bgmn.de.
6. Born, M. & Wolf, E. (1965). Principles of Optics. London: PergamonPress.
7. Bronstein, I. N. & Semendjajew, (1997). Taschenbuch der Mathematik. Frankfurt Am Main: Thun.
8. Cheary, R. W. & Coelho, A. (1992). J. Appl. Cryst. 25, 109-121.
9. Cheary, R. W. & Coelho, A. (1998). J. Appl. Cryst. 31, 851-861.
10. Cheary, R. W., Coelho, A. A. & Cline, J. (2004). J. Res. Natl Inst. Stand. Technol. 109, 1-25.
11. Deutsch, M., Förster, E., Hölzer, G., Härtwig, J., Hämäläinen, K., Kao, C.-C., Huotari, S. & Diamant, R. (2004). J. Res. Natl Inst. Stand. Technol. 109, 75-98.
12. Finger, L. W., Cox, D. & Jephcoat, A. (1994). J. Appl. Cryst. 27, 892-900.
13. Honkimäki, V. (1996). J. Appl. Cryst. 29, 617-624.
14. Ida, T. (1998). Rev. Sci. Instrum. 69, 2268-2272.
15. Ida, T. & Kimura, K. (1999a). J. Appl. Cryst. 32, 634-640.
16. Ida, T. & Kimura, K. (1999b). J. Appl. Cryst. 32, 982-991.
17. Jennings, G. A. (1994). Modern Geometry with Applications. New York: Springer-Verlag.
18. Kleber, W., Bautsch, H.-J. & Bohm, J. (1998). Einführung in die Kristallographie. Munich: Oldenbourg.
19. Klug, H. & Alexander, L. (1974). X-ray Diffraction Procedure for Polycrystalline and Amorphous Materials. New York: John Wiley.
20. Kogan, V. A. & Kupriyanov, M. F. (1992). J. Appl. Cryst. 25, 16-25.
21. Laar, B. van & Yelon, W. B. (1984). J. Appl. Cryst. 17, 47-54.
22. Le Bail, A. (1998). Advances in X-ray Analysis, Vol. 42, pp. 191-203. Denver: JCPDS - International Centre for Diffraction Data.
23. Masson, O., Dooryhee, E. & Fitch, A. (2003). J. Appl. Cryst. 36, 286-294.
24. Masson, O., Guinebretière, R. & Dauger, A. (2001). J. Appl. Cryst. 34, 436-441.
25. Reefman, D. (1996). Powder Diffr. 11, 107.
26. Rietveld, H. M. (1969). J. Appl. Cryst. 2, 65-71.
27. Sanchez del Rio, M., Ferrero, C. & Mocella, V. (1997). Proc. SPIE, 3152, 136-146.
28. Wilson, A. E. C. (1963). Mathematical Theory of X-ray Powder Diffractometry. Eindhoven: Philips Technical Library.