The analysis of homogeneously and inhomogeneously anisotropic microstructures by X-ray diffraction

Powder Diffraction

Volumn 20, Issue 4, 2005, Pages 376-392

  Welzel, Udo ^a   Mittemeijer, Eric J ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Anisotropy; Depth gradients; Diffraction line profile analysis; Grain interaction; Microstructure; Stress; Texture

Indexed keywords

ANISOTROPIC MICROSTRUCTURES; DEPTH GRADIENT; DIFFRACTION LINES; ELASTIC GRAIN INTERACTIONS; GRAIN INTERACTION; INHOMOGENEOUS MICROSTRUCTURE; MICROSTRUCTURAL FEATURES; STRUCTURAL IMPERFECTIONS;

MICROSTRUCTURAL EVOLUTION; MICROSTRUCTURE; STRESSES; TEXTURES; X RAY DIFFRACTION;

ANISOTROPY;

EID: 29244490348     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.2138066     Document Type: Article

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