-
7
-
-
0001856349
-
-
Snyder, R. L, Fiala, J, Bunge, H. J, Eds, Oxford University Press
-
Snyder, R. L.; Fiala, J.; Bunge, H. J. (Eds.): Defect and Microstructure Analysis by Diffraction. Oxford University Press, 1999, pp. 127-140.
-
(1999)
Defect and Microstructure Analysis by Diffraction
, pp. 127-140
-
-
-
9
-
-
33947584138
-
-
Klimanek, P, Private comm
-
Klimanek, P.: Private comm.
-
-
-
-
10
-
-
33947604434
-
-
Barabash, R. I.: X-ray analysis of precipitation-related crystals with dislocation substructure. In: Defect and Microstructure Analysis by Diffraction (Eds. by R. L. Snyder; J. Fiala; H. J. Bunge), pp. 127-140. Oxford University Press, 1999.
-
Barabash, R. I.: X-ray analysis of precipitation-related crystals with dislocation substructure. In: Defect and Microstructure Analysis by Diffraction (Eds. by R. L. Snyder; J. Fiala; H. J. Bunge), pp. 127-140. Oxford University Press, 1999.
-
-
-
-
11
-
-
0031141147
-
-
Kuzel, R.; Houska, C. R.: Baoping He: Characterization of severe matrix distortions during phase separation from the redistribution of diffracted intensities. J. Mat. Sci. 32 (1997) 2451-2465.
-
Kuzel, R.; Houska, C. R.: Baoping He: Characterization of severe matrix distortions during phase separation from the redistribution of diffracted intensities. J. Mat. Sci. 32 (1997) 2451-2465.
-
-
-
-
12
-
-
84996160008
-
Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray Debye-Scherrer spectrum
-
Williamson, G. K.; Smallman, R. E.: Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray Debye-Scherrer spectrum. Philos. Mag. 1 (1956) 34-46.
-
(1956)
Philos. Mag
, vol.1
, pp. 34-46
-
-
Williamson, G.K.1
Smallman, R.E.2
-
13
-
-
0002455450
-
Theory of X-ray scattering by crystals containing dislocations
-
Krivoglaz, M. A.; Ryaboshapka, K. P.: Theory of X-ray scattering by crystals containing dislocations. Phys. Met. Metallogr. 15 (1963) 18-31.
-
(1963)
Phys. Met. Metallogr
, vol.15
, pp. 18-31
-
-
Krivoglaz, M.A.1
Ryaboshapka, K.P.2
-
14
-
-
0014803629
-
The determination of density and distribution of dislocations in deformed single crystals from broadened X-ray diffraction profiles
-
Wilkens, M.: The determination of density and distribution of dislocations in deformed single crystals from broadened X-ray diffraction profiles. Phys. Stat. Sol. A2 (1970) 359-370.
-
(1970)
Phys. Stat. Sol. A
, vol.2
, pp. 359-370
-
-
Wilkens, M.1
-
15
-
-
0020884638
-
Influence of correlation in dislocation arrangement on the X-ray diffraction by deformed crystals
-
Krivoglaz, M. A.; Martynenko, O. V.; Ryaboshapka, K. P.: Influence of correlation in dislocation arrangement on the X-ray diffraction by deformed crystals. Fiz. Met. Metalloved. 55 (1983) 5-17.
-
(1983)
Fiz. Met. Metalloved
, vol.55
, pp. 5-17
-
-
Krivoglaz, M.A.1
Martynenko, O.V.2
Ryaboshapka, K.P.3
-
16
-
-
84914027357
-
-
Groma, T.; Ungár, T.; Wilkens, M.: Asymmetric X-ray line broadening of plastically deformed crystals. I. Theory. J. Appl. Cryst. 22 (1988) 47-53.
-
Groma, T.; Ungár, T.; Wilkens, M.: Asymmetric X-ray line broadening of plastically deformed crystals. I. Theory. J. Appl. Cryst. 22 (1988) 47-53.
-
-
-
-
17
-
-
0001811006
-
Asymmetric X-ray line broadening of plastically deformed crystals. II. Evaluation procedure and application to [001]/Cu crystals
-
Ungár, T.; Groma, I.; Wilkens, M.: Asymmetric X-ray line broadening of plastically deformed crystals. II. Evaluation procedure and application to [001]/Cu crystals. J. Appl. Cryst. 22 (1989) 26-34.
-
(1989)
J. Appl. Cryst
, vol.22
, pp. 26-34
-
-
Ungár, T.1
Groma, I.2
Wilkens, M.3
-
18
-
-
0000627505
-
X-ray diffraction line broadening due to dislocations in non-cubic crystalline materials. III. Experimental results for plastically deformed zirconium
-
Kužel, R.; Klimanek, P.: X-ray diffraction line broadening due to dislocations in non-cubic crystalline materials. III. Experimental results for plastically deformed zirconium. J. Appl. Cryst. 22 (1989) 299-307.
-
(1989)
J. Appl. Cryst
, vol.22
, pp. 299-307
-
-
Kužel, R.1
Klimanek, P.2
-
19
-
-
0002593283
-
X-ray diffraction line broadening due to dislocations in non-cubic crystalline materials. II. The case of elastic anisotropy applied to hexagonal crystals
-
Klimanek, P.; Kužel, R.: X-ray diffraction line broadening due to dislocations in non-cubic crystalline materials. II. The case of elastic anisotropy applied to hexagonal crystals. J. Appl. Cryst. 21 (1988) 59-66.
-
(1988)
J. Appl. Cryst
, vol.21
, pp. 59-66
-
-
Klimanek, P.1
Kužel, R.2
-
20
-
-
85009870192
-
X-ray diffraction line broadening due to dislocations in non-cubic crystalline materials. I. General considerations and the case of elastic isotropy applied to hexagonal crystals
-
Klimanek P.; Kužel, R.: X-ray diffraction line broadening due to dislocations in non-cubic crystalline materials. I. General considerations and the case of elastic isotropy applied to hexagonal crystals. J. Appl. Cryst. 21 (1988) 363-368.
-
(1988)
J. Appl. Cryst
, vol.21
, pp. 363-368
-
-
Klimanek, P.1
Kužel, R.2
-
23
-
-
33845794134
-
The effect of dislocation contrast on X-ray line profiles in untextured polycrystals
-
Ungár, T.; Tichý, G.: The effect of dislocation contrast on X-ray line profiles in untextured polycrystals. Phys. Stat. Sol. 17 (1999) 42-43.
-
(1999)
Phys. Stat. Sol
, vol.17
, pp. 42-43
-
-
Ungár, T.1
Tichý, G.2
-
24
-
-
0000276471
-
Borbély: The contrast factors of dislocations in cubic crystals: the dislocation model of strain anisotropy in practice. A
-
Ungár, T.; Dragomir, I.; Révész, A.; Borbély: The contrast factors of dislocations in cubic crystals: the dislocation model of strain anisotropy in practice. A. J. Appl. Cryst. 32 (1999) 992-1002.
-
(1999)
J. Appl. Cryst
, vol.32
, pp. 992-1002
-
-
Ungár, T.1
Dragomir, I.2
Révész, A.3
-
25
-
-
0036789443
-
Contrast factors of dislocations in hexagonal crystal system
-
Dragomir, I.; Ungár, T.: Contrast factors of dislocations in hexagonal crystal system. J. Appl. Cryst. 35 (2002) 556-564.
-
(2002)
J. Appl. Cryst
, vol.35
, pp. 556-564
-
-
Dragomir, I.1
Ungár, T.2
-
26
-
-
0034495519
-
X-ray diffraction line broadening from thermally deposited gold films
-
Cheary, R.; Dooryhee, E.; Lynch, P.; Armstrong, N.; Dligatch, S.: X-ray diffraction line broadening from thermally deposited gold films. J. Appl. Cryst. 33 (2000) 1271-1283.
-
(2000)
J. Appl. Cryst
, vol.33
, pp. 1271-1283
-
-
Cheary, R.1
Dooryhee, E.2
Lynch, P.3
Armstrong, N.4
Dligatch, S.5
-
27
-
-
3242728180
-
Determining the dislcoation contrast factor for X-ray line profile analysis
-
Eds. E. J. Mittemeijer; P. Scardi pp, Springer. Berlin. Heidelberg
-
Armstrong, N.; Lynch, P.: Determining the dislcoation contrast factor for X-ray line profile analysis. In: Diffraction Analysis of the Microstructure of Materials (Eds. E. J. Mittemeijer; P. Scardi) pp. 249-286. Springer. Berlin. Heidelberg, 2003.
-
(2003)
Diffraction Analysis of the Microstructure of Materials
, pp. 249-286
-
-
Armstrong, N.1
Lynch, P.2
-
28
-
-
33947581136
-
-
Vermeulen A. C.; Delhez, R.; deKijser Th. H.; Mittemeijer, E. J.: Diffraction-line broadening analysis of dislocation configurations. In: Defect and Microstructure Analysis by Diffraction (Eds. by R. L. Snyder; J. Fiala; H. J. Bunge) pp. 200-213. Oxford University Press, 1999.
-
Vermeulen A. C.; Delhez, R.; deKijser Th. H.; Mittemeijer, E. J.: Diffraction-line broadening analysis of dislocation configurations. In: Defect and Microstructure Analysis by Diffraction (Eds. by R. L. Snyder; J. Fiala; H. J. Bunge) pp. 200-213. Oxford University Press, 1999.
-
-
-
-
29
-
-
0021515648
-
-
Yuming Wang; Zigung Zhang: X-ray fine profile analysis of deformed Al. Appl. Phys. A35 (1984) 109-114.
-
Yuming Wang; Zigung Zhang: X-ray fine profile analysis of deformed Al. Appl. Phys. A35 (1984) 109-114.
-
-
-
-
30
-
-
0034993318
-
Crystallite size distribution and dislocation structure determined by diffraction profile analysis
-
Ungár, T.; Gubicza, J.; Ribárik, G.; Borbély, A.: Crystallite size distribution and dislocation structure determined by diffraction profile analysis. J. Appl. Cryst. 34 (2001) 298-310.
-
(2001)
J. Appl. Cryst
, vol.34
, pp. 298-310
-
-
Ungár, T.1
Gubicza, J.2
Ribárik, G.3
Borbély, A.4
-
31
-
-
0034474942
-
Calculation of diffraction line profiles from specimens with dislocations. A comparison of analytical models with computer simulations
-
Kamminga, J. D.; Delhez, R.: Calculation of diffraction line profiles from specimens with dislocations. A comparison of analytical models with computer simulations. J. Appl. Cryst 33 (2000) 1122-1127.
-
(2000)
J. Appl. Cryst
, vol.33
, pp. 1122-1127
-
-
Kamminga, J.D.1
Delhez, R.2
-
32
-
-
0035177560
-
Calculation of diffraction line profiles for structures with dislocations
-
Kamminga, J. D.; Delhez, R.: Calculation of diffraction line profiles for structures with dislocations. Mat. Sci. Forum 378-381 (2001) 142-147.
-
(2001)
Mat. Sci. Forum
, vol.378-381
, pp. 142-147
-
-
Kamminga, J.D.1
Delhez, R.2
-
33
-
-
33947576480
-
Determination of non-uniform dislocation distributions in polycrystalline materials
-
Eds. E. J. Mittemeijer; P. Scardi pp, Springer. Berlin. Heidelberg
-
Kamminga, J. D.; Sijbel, L. J.; Delhez. R.: Determination of non-uniform dislocation distributions in polycrystalline materials. In: Diffraction Analysis of the Microstructure of Materials (Eds. E. J. Mittemeijer; P. Scardi) pp. 309-331. Springer. Berlin. Heidelberg, 2003.
-
(2003)
Diffraction Analysis of the Microstructure of Materials
, pp. 309-331
-
-
Kamminga, J.D.1
Sijbel, L.J.2
Delhez, R.3
-
35
-
-
33846404895
-
Considerations concerning Wilkens theory of dislocation line-broadening
-
Armstrong, N.; Leoni, M.; Scardi, P.: Considerations concerning Wilkens theory of dislocation line-broadening. Z. Kristallogr. Suppl. 23 (2006) 81-86.
-
(2006)
Z. Kristallogr. Suppl
, vol.23
, pp. 81-86
-
-
Armstrong, N.1
Leoni, M.2
Scardi, P.3
-
36
-
-
0018469113
-
Simplifications in X-ray line-shape analysis
-
Adler, T.; Houska, C. R.: Simplifications in X-ray line-shape analysis. J. Appl. Phys. 17 (1979) 3282-3287.
-
(1979)
J. Appl. Phys
, vol.17
, pp. 3282-3287
-
-
Adler, T.1
Houska, C.R.2
-
37
-
-
0019529993
-
Least-squares analysis of X-ray diffraction line shapes with analytic functions
-
Houska, C. R.; Smith, T. M.: Least-squares analysis of X-ray diffraction line shapes with analytic functions. J. Appl. Phys. 52(2) (1981) 748-754.
-
(1981)
J. Appl. Phys
, vol.52
, Issue.2
, pp. 748-754
-
-
Houska, C.R.1
Smith, T.M.2
-
38
-
-
0006639132
-
Analytic functions describing line profiles influenced by size distribution, strain and stacking faults
-
Ed. by R. L. Snyder; J. Fiala; H. J. Bunge pp, Oxford University Press
-
Houska, C. R.; Kuzel, R.: Analytic functions describing line profiles influenced by size distribution, strain and stacking faults. In: Defect and Microstructure Analysis by Diffraction (Ed. by R. L. Snyder; J. Fiala; H. J. Bunge) pp. 141-164. Oxford University Press, 1999.
-
(1999)
Defect and Microstructure Analysis by Diffraction
, pp. 141-164
-
-
Houska, C.R.1
Kuzel, R.2
-
39
-
-
0039545033
-
Analytical X-ray fine profile analysis based upon correlated dislcoations
-
Rao, S.; Houska, C. R.: Analytical X-ray fine profile analysis based upon correlated dislcoations. Acta Cryst. A44 (1988) 1021-1028.
-
(1988)
Acta Cryst. A
, vol.44
, pp. 1021-1028
-
-
Rao, S.1
Houska, C.R.2
-
40
-
-
4043129909
-
Whole powder pattern modelling: Theory and applications
-
Eds. E. J. Mittemeijer; P. Scardi pp, Springer. Berlin. Heidelberg
-
Scardi, P.; Leoni. M.: Whole powder pattern modelling: Theory and applications. In: Diffraction Analysis of the Microstructure of Materials (Eds. E. J. Mittemeijer; P. Scardi) pp. 51-92. Springer. Berlin. Heidelberg, 2003.
-
(2003)
Diffraction Analysis of the Microstructure of Materials
, pp. 51-92
-
-
Scardi, P.1
Leoni, M.2
-
41
-
-
0036098960
-
Whole powder pattern modelling
-
Scardi, P.; Leoni, M.: Whole powder pattern modelling. Acta Cryst. A58 (2002) 190-200.
-
(2002)
Acta Cryst. A
, vol.58
, pp. 190-200
-
-
Scardi, P.1
Leoni, M.2
-
42
-
-
0001316953
-
Whole diffraction pattern-fitting of polycrystalline fcc materials based on microstructure
-
Scardi. P.; Leoni M.; Dong Y. H.: Whole diffraction pattern-fitting of polycrystalline fcc materials based on microstructure. Eur. Phys. J. B18 (2000) 23-30.
-
(2000)
Eur. Phys. J. B
, vol.18
, pp. 23-30
-
-
Scardi, P.1
Leoni, M.2
Dong, Y.H.3
-
43
-
-
33846438224
-
PM2K: A flexible program implementing Whole Powder Pattern Modelling
-
Leoni, M.; Confente, T.; Scardi, P.: PM2K: a flexible program implementing Whole Powder Pattern Modelling. Z. Kristallogr. Suppl. 23 (2006) 249-254.
-
(2006)
Z. Kristallogr. Suppl
, vol.23
, pp. 249-254
-
-
Leoni, M.1
Confente, T.2
Scardi, P.3
-
44
-
-
0034789824
-
Gubicza: MWP-fit: a program for Multiple Whole Profile fitting of diffraction peak profiles by ab-initio theoretical functions
-
Ribárik, G.; Ungár, T.; Gubicza: MWP-fit: a program for Multiple Whole Profile fitting of diffraction peak profiles by ab-initio theoretical functions. J. Appl. Cryst. 34 (2001) 669-676.
-
(2001)
J. Appl. Cryst
, vol.34
, pp. 669-676
-
-
Ribárik, G.1
Ungár, T.2
-
45
-
-
33846407595
-
Analysis of polydisperse ball-milled fluorite powders using a full pattern technique
-
Leoni, M.; De Giudici, G.; Biddau, R.; D'Incau, M.; Scardi, P.: Analysis of polydisperse ball-milled fluorite powders using a full pattern technique. Z. Kristallogr. Suppl. 23 (2006) 111-116.
-
(2006)
Z. Kristallogr. Suppl
, vol.23
, pp. 111-116
-
-
Leoni, M.1
De Giudici, G.2
Biddau, R.3
D'Incau, M.4
Scardi, P.5
-
46
-
-
29144468897
-
2 (M = Ca, Sr, Ba and Cd), determined by X-ray diffraction line-profile analysis
-
2 (M = Ca, Sr, Ba and Cd), determined by X-ray diffraction line-profile analysis. J. Appl. Cryst. 38 (2005) 912-926.
-
(2005)
J. Appl. Cryst
, vol.38
, pp. 912-926
-
-
Ribárik, G.1
Audebrand, N.2
Palancher, H.3
Ungár, T.4
Gubicza, J.5
Louer, D.6
-
48
-
-
4243753590
-
The density and the character of dislocations in cubic and hexagonal polycrystals determined by X-ray diffraction
-
Gubicza, J.; Ribárik, G.; Goren-Muginstein, G. R.; Rosen, A. R. I.; Ungár, T.: The density and the character of dislocations in cubic and hexagonal polycrystals determined by X-ray diffraction. Mat. Sci. Eng. A309-310 (2001) 60-63.
-
(2001)
Mat. Sci. Eng. A
, vol.309-310
, pp. 60-63
-
-
Gubicza, J.1
Ribárik, G.2
Goren-Muginstein, G.R.3
Rosen, A.R.I.4
Ungár, T.5
-
49
-
-
0000534299
-
Particle size distribution and dislocation density determined by high resolution X-ray diffraction in nanocrystalline silicon nitride powders
-
Gubicza, J.; Szépvölgyi, J.; Mohai, I.; Zsoldos, L.; Ungár, T.: Particle size distribution and dislocation density determined by high resolution X-ray diffraction in nanocrystalline silicon nitride powders. Mat. Sci. Eng. A280 (2000) 263-269.
-
(2000)
Mat. Sci. Eng. A
, vol.280
, pp. 263-269
-
-
Gubicza, J.1
Szépvölgyi, J.2
Mohai, I.3
Zsoldos, L.4
Ungár, T.5
-
50
-
-
33846417990
-
Microstructure of post-deformed ECAP-Ti investigated by Multiple X-Ray Line Profile Analysis
-
Schafler, E.; Nyilas, K.; Bernstorff, S.; Zeipper, L.; Zehetbauer, M.; Ungár, T.: Microstructure of post-deformed ECAP-Ti investigated by Multiple X-Ray Line Profile Analysis. Z. Kristallogr. Suppl. 23 (2006) 129-134.
-
(2006)
Z. Kristallogr. Suppl
, vol.23
, pp. 129-134
-
-
Schafler, E.1
Nyilas, K.2
Bernstorff, S.3
Zeipper, L.4
Zehetbauer, M.5
Ungár, T.6
-
51
-
-
33845802073
-
The dislocation-structure and crystallite size in forsterite (olivine) deformed at 1400°C by 11 GPa
-
Nyilas, K.; Couvy, H.; Cordier, P.; Ungár, T.: The dislocation-structure and crystallite size in forsterite (olivine) deformed at 1400°C by 11 GPa. Z. Kristallogr. Suppl. 23 (2006) 135-140.
-
(2006)
Z. Kristallogr. Suppl
, vol.23
, pp. 135-140
-
-
Nyilas, K.1
Couvy, H.2
Cordier, P.3
Ungár, T.4
-
52
-
-
33846463056
-
Thermal stability of the microstructure of severely deformed copper
-
Balogh, L.; Gubicza, J.; Hellmig, R. J.; Estrin, Y.; Ungár, T.: Thermal stability of the microstructure of severely deformed copper. Z. Kristallogr. Suppl. 23 (2006) 381-386.
-
(2006)
Z. Kristallogr. Suppl
, vol.23
, pp. 381-386
-
-
Balogh, L.1
Gubicza, J.2
Hellmig, R.J.3
Estrin, Y.4
Ungár, T.5
-
53
-
-
0037625719
-
Computer program ANIZC for the calculation of diffraction contrast factors of dislocations in elastically anisotropic cubic, hexagonal and trigonal crystals
-
Borbély, A.; Dragomir-Cernatescu, J.; Ribárik, G.; Ungár, T.: Computer program ANIZC for the calculation of diffraction contrast factors of dislocations in elastically anisotropic cubic, hexagonal and trigonal crystals. J. Appl. Cryst. 36 (2003) 160-162.
-
(2003)
J. Appl. Cryst
, vol.36
, pp. 160-162
-
-
Borbély, A.1
Dragomir-Cernatescu, J.2
Ribárik, G.3
Ungár, T.4
-
55
-
-
33947592486
-
-
Wilkens, M.: The mean square stresses for a completely random and restrictedly random distribution of dislocations in a cylindrical body. In: Fundamental aspects of dislocation theory (Eds. J. Simmons; R. De Witt; R. Bullough) NBS Spec. Publ. 317, pp. 1191-1193. Washington, 1969.
-
Wilkens, M.: The mean square stresses for a completely random and restrictedly random distribution of dislocations in a cylindrical body. In: Fundamental aspects of dislocation theory (Eds. J. Simmons; R. De Witt; R. Bullough) NBS Spec. Publ. 317, pp. 1191-1193. Washington, 1969.
-
-
-
-
56
-
-
33947602505
-
-
Wilkens, M.: Theoretical aspect of kinematical X-ray diffraction profiles from crystals containing dislcoation distributions. In: Fundamental aspects of dislocation theory (Eds. J. Simmons; R. De Witt; R. Bullough) NBS Spec. Publ. 317) pp. 1195-1221. Washington, 1969.
-
Wilkens, M.: Theoretical aspect of kinematical X-ray diffraction profiles from crystals containing dislcoation distributions. In: Fundamental aspects of dislocation theory (Eds. J. Simmons; R. De Witt; R. Bullough) NBS Spec. Publ. 317) pp. 1195-1221. Washington, 1969.
-
-
-
-
57
-
-
4043108748
-
X-ray peak broadening due to inhomogeneous dislocation distributions
-
Eds. E. J. Mittemeijer; P. Scardi pp, Springer. Berlin. Heidelberg
-
Groma, I.; Borbély, A.: X-ray peak broadening due to inhomogeneous dislocation distributions. In: Diffraction Analysis of the Microstructure of Materials (Eds. E. J. Mittemeijer; P. Scardi) pp. 287-307. Springer. Berlin. Heidelberg, 2003.
-
(2003)
Diffraction Analysis of the Microstructure of Materials
, pp. 287-307
-
-
Groma, I.1
Borbély, A.2
-
58
-
-
0000838006
-
Characterization of self-similar dislocation patterns by X-ray diffraction
-
Székely, F.; Groma, I.; Lendvai, J.: Characterization of self-similar dislocation patterns by X-ray diffraction. Phys Rev. B62 (2000) 3093-3098.
-
(2000)
Phys Rev. B
, vol.62
, pp. 3093-3098
-
-
Székely, F.1
Groma, I.2
Lendvai, J.3
-
59
-
-
33846424947
-
Momentum method applied to evaluation of size and strain in ball-milled iron
-
Borbély, A.; Révész, A.; Groma, I.: Momentum method applied to evaluation of size and strain in ball-milled iron. Z. Kristallogr. Suppl. 23 (2006) 87-92.
-
(2006)
Z. Kristallogr. Suppl
, vol.23
, pp. 87-92
-
-
Borbély, A.1
Révész, A.2
Groma, I.3
-
60
-
-
0034491579
-
X-ray determination of dislocation density and arrangement in plastically deformed copper
-
Breuer, D.; Klimanek, P.; Pantleon, W.: X-ray determination of dislocation density and arrangement in plastically deformed copper. J. Appl. Cryst. 33 (2000) 1284-1294.
-
(2000)
J. Appl. Cryst
, vol.33
, pp. 1284-1294
-
-
Breuer, D.1
Klimanek, P.2
Pantleon, W.3
-
61
-
-
33947594824
-
-
Barabash, R. I.; Klimanek, P.: Anisotropy of X-ray and neutron scattering by crystals with dislocation walls. In: Advances in Structure Analysis (Eds. R. Kužel; J. Haek) pp. 438-448. Czech and Slovak Crystallographic Assoc. Prague, 2001.
-
Barabash, R. I.; Klimanek, P.: Anisotropy of X-ray and neutron scattering by crystals with dislocation walls. In: Advances in Structure Analysis (Eds. R. Kužel; J. Haek) pp. 438-448. Czech and Slovak Crystallographic Assoc. Prague, 2001.
-
-
-
-
62
-
-
19944370881
-
X-ray scattering by crystals with local lattice rotation fields
-
Barabash, R. I.; Klimanek, P.: X-ray scattering by crystals with local lattice rotation fields. J. Appl. Cryst. 32 (1999) 1050-1059.
-
(1999)
J. Appl. Cryst
, vol.32
, pp. 1050-1059
-
-
Barabash, R.I.1
Klimanek, P.2
-
63
-
-
33947611674
-
-
Kužel, R.; Holý, V.; Čerňanský, M.; Kuběna, J.; Šimek, D.; Kub, J.: Study of submicrocrystalline materials by diffuse scattering in transmitted wave. In: Diffraction Analysis of the Microstructure of Materials (Eds. P. Scardi; E. J. Mittemeijer) pp. 229-245. Springer Series in Materials Science 68. Springer. Berlin. Heidelberg, 2003.
-
Kužel, R.; Holý, V.; Čerňanský, M.; Kuběna, J.; Šimek, D.; Kub, J.: Study of submicrocrystalline materials by diffuse scattering in transmitted wave. In: Diffraction Analysis of the Microstructure of Materials (Eds. P. Scardi; E. J. Mittemeijer) pp. 229-245. Springer Series in Materials Science 68. Springer. Berlin. Heidelberg, 2003.
-
-
-
-
64
-
-
33746395146
-
Reciprocal-space mapping for simultaneous determination of texture and stress in thin films
-
Šimek, D.; Kužel, R.; Rafaja, D.: Reciprocal-space mapping for simultaneous determination of texture and stress in thin films. J. Appl. Cryst. 39 (2006) 487-501.
-
(2006)
J. Appl. Cryst
, vol.39
, pp. 487-501
-
-
Šimek, D.1
Kužel, R.2
Rafaja, D.3
-
65
-
-
4043159891
-
Interference phenomena observed by X-ray diffraction in nanocrystalline thin films
-
Rafaja, D.; Klemm, V.; Schreiber, G.; Knapp, M.; Kuzel, R.: Interference phenomena observed by X-ray diffraction in nanocrystalline thin films. J. Appl. Cryst. 37 (2004) 613-620.
-
(2004)
J. Appl. Cryst
, vol.37
, pp. 613-620
-
-
Rafaja, D.1
Klemm, V.2
Schreiber, G.3
Knapp, M.4
Kuzel, R.5
-
66
-
-
0002156935
-
Problems in diffraction analysis of real polycrystals
-
Ed. J. Hasek pp, New York: Plenum Press
-
Klimanek, P.: Problems in diffraction analysis of real polycrystals. In: X-ray and Neutron Structure Analysis in Materials Science (Ed. J. Hasek) pp. 125-138. New York: Plenum Press, 1989.
-
(1989)
X-ray and Neutron Structure Analysis in Materials Science
, pp. 125-138
-
-
Klimanek, P.1
-
67
-
-
0034851821
-
Diffraction line profiles from polydisperse crystalline systems
-
Scardi, P.; Leoni, M.: Diffraction line profiles from polydisperse crystalline systems. Acta Cryst. A57 (2001) 604-613.
-
(2001)
Acta Cryst. A
, vol.57
, pp. 604-613
-
-
Scardi, P.1
Leoni, M.2
-
68
-
-
4043062162
-
Nanocrystalline domain size distributions from powder diffraction data
-
Leoni, M.; Scardi, P. J.: Nanocrystalline domain size distributions from powder diffraction data. Appl. Cryst. 37 (2004) 629-634.
-
(2004)
Appl. Cryst
, vol.37
, pp. 629-634
-
-
Leoni, M.1
Scardi, P.J.2
-
69
-
-
0034496849
-
Effect of a crystallite size distribution on X-ray diffraction line profiles and whole-powder-pattern fitting
-
Langford, J. I.; Louer, D.; Scardi, P. J.: Effect of a crystallite size distribution on X-ray diffraction line profiles and whole-powder-pattern fitting. Appl. Cryst. 33 (2000) 964-974.
-
(2000)
Appl. Cryst
, vol.33
, pp. 964-974
-
-
Langford, J.I.1
Louer, D.2
Scardi, P.J.3
-
70
-
-
0032034090
-
Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis
-
Krill, C. E.; Birringer, R.: Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis. Philosophical Magazine 77 (1998) 621-640.
-
(1998)
Philosophical Magazine
, vol.77
, pp. 621-640
-
-
Krill, C.E.1
Birringer, R.2
-
71
-
-
4043054262
-
Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles
-
Armstrong N.; Kalceff, W.; Cline, J. P.; Bonevich, J.: Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles. J. Res. Nat. Inst. Stand. Techn. 109(1) (2004) 155-178.
-
(2004)
J. Res. Nat. Inst. Stand. Techn
, vol.109
, Issue.1
, pp. 155-178
-
-
Armstrong, N.1
Kalceff, W.2
Cline, J.P.3
Bonevich, J.4
-
72
-
-
33947606218
-
Development of a NIST SRM 1979 nano-crystallite size standard for broadening of X-ray line profiles
-
Armstrong, N.; Cline, J. P.; Ritter, J.; Bonevich, J.: Development of a NIST SRM 1979 nano-crystallite size standard for broadening of X-ray line profiles. Acta Cryst. A61 (2005) C79.
-
(2005)
Acta Cryst. A
, vol.61
-
-
Armstrong, N.1
Cline, J.P.2
Ritter, J.3
Bonevich, J.4
-
73
-
-
3543110931
-
Line broadening analysis using integral breadth methods: A critical review
-
Scardi, P.; Leoni, M.; Delhez, R.: Line broadening analysis using integral breadth methods: a critical review. J. Appl. Cryst. 37 (2004) 381-390.
-
(2004)
J. Appl. Cryst
, vol.37
, pp. 381-390
-
-
Scardi, P.1
Leoni, M.2
Delhez, R.3
-
74
-
-
0000344888
-
Diffraction-line broadening due to strain fields in materials: Fundamental aspects and methods of analysis
-
van Berkum, J. G. M.; Delhez, R.; de Keijser Th. H.; Mittemeijer, E. J.: Diffraction-line broadening due to strain fields in materials: Fundamental aspects and methods of analysis. Acta Cryst. A52 (1996) 730-747.
-
(1996)
Acta Cryst. A
, vol.52
, pp. 730-747
-
-
van Berkum, J.G.M.1
Delhez, R.2
de Keijser Th, H.3
Mittemeijer, E.J.4
|