Diffraction analysis of layer disorder

Zeitschrift fur Kristallographie

Volumn 223, Issue 9, 2008, Pages 561-568

  Leoni, Matteo ^a  

^a UNIVERSITY OF TRENTO   (Italy)

Author keywords

Planar faulting; Stacking disorder; X ray diffraction

Indexed keywords

EID: 58149357630     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.2008.1214     Document Type: Conference Paper

References (23)

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