Instrument line-profile synthesis in high-resolution synchrotron powder diffraction

Journal of Applied Crystallography

Volumn 36, Issue 2, 2003, Pages 286-294

  Masson, O ^a,b   Dooryhee E ^c,d   Fitch, A N ^b,d  

^a UNIVERSITY OF LIMOGES   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^d KEELE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ARTICLE; CALCULATION; INSTRUMENT; MATHEMATICAL MODEL; METHODOLOGY; PARTICLE SIZE; SYNCHROTRON; SYNTHESIS; X RAY POWDER DIFFRACTION;

EID: 0037395162     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803001031     Document Type: Article

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