Deconvolution of instrumental aberrations for synchrotron powder x-ray diffractometry

Journal of Applied Crystallography

Volumn 36, Issue 2, 2003, Pages 181-187

  Ida, T ^a   Hibino, H ^a   Toraya, H ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ARTIFACT REDUCTION; DATA ANALYSIS; DEVICE; FOURIER TRANSFORMATION; SYNCHROTRON; X RAY POWDER DIFFRACTION;

EID: 0037393378     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889802021131     Document Type: Article

References (12)

1. Cox, D. E. (1992). Synchrotron Radiation Crystallography, pp. 186-254. New York: Academic Press.
2. Estermann, M. A. & Gramlich, V. (1993). J. Appl. Cryst. 26, 396-404.
3. Hart, M., Cernik, R. J., Parrish, W. & Toraya, H. (1990). J. Appl. Cryst. 23, 286-291.
4. Ida, T. (1998). Rev. Sci. Instrum. 69, 3837-3839.
5. Ida, T., Ando, M. & Toraya, H. (2000). J. Appl. Cryst. 33, 1311-1316.
6. Ida, T., Hibino, H. & Toraya, H. (2001). J. Appl. Cryst. 34, 144-151.
7. Ida, T. & Kimura, K. (1999). J. Appl. Cryst. 32, 982-991.
8. Ida, T. & Toraya, H. (2002). J. Appl. Cryst. 35, 58-68.
9. Lipson, H. & Langford, J. I. (1999). International Tables for Crystallography, Vol. C, edited by A. J. C. Wilson & E. Prince, pp. 590-592. Dordrecht: Kluwer Academic Publishers.
10. Press, W. H., Flannery, B. P., Teukolsky, S. A. & Vetterling, W. T. (1986). Numerical Recipes. Cambridge University Press.
11. Rasberry, S. D. (1989). Certificate of Analysis, Standard Reference Material 660. Instrument Line Position and Profile Shape Standard for X-ray Powder Diffraction. National Institute of Standards and Technology, Gaithersburg, MD, USA.
12. Toraya, H., Hibino, H. & Ohsumi, K. (1996). J. Synchrotron Rad. 3, 75-83.