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Volumn 37, Issue 1, 2004, Pages 123-135

Diffraction line broadening due to lattice-parameter variations caused by a spatially varying scalar variable: Its orientation dependence caused by locally varying nitrogen content in ε-FeN0.433

Author keywords

[No Author keywords available]

Indexed keywords

NITROGEN;

EID: 3242877011     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803026906     Document Type: Article
Times cited : (68)

References (44)
  • 14
    • 3242883984 scopus 로고
    • version 7.4, University of Dortmund
    • Koths, K. (1987). ASIN, version 7.4, University of Dortmund.
    • (1987) ASIN
    • Koths, K.1
  • 25
    • 3242890112 scopus 로고    scopus 로고
    • Personal communication
    • Petricek, V. (2002). Personal communication.
    • (2002)
    • Petricek, V.1
  • 34
    • 3242887002 scopus 로고    scopus 로고
    • Version 1.0c. Philips Electronics NV, Eindhoven, The Netherlands
    • Sonneveld, E. J. & Delhez. R. (1996) PROFIT. Version 1.0c. Philips Electronics NV, Eindhoven, The Netherlands.
    • (1996) PROFIT
    • Sonneveld, E.J.1    Delhez, R.2
  • 43
    • 0002450903 scopus 로고
    • edited by R. A. Young, Oxford University Press
    • Young, R. A. (1993b). The Rietveld Method, edited by R. A. Young, pp. 1-38. Oxford University Press.
    • (1993) The Rietveld Method , pp. 1-38
    • Young, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.