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Volumn 21, Issue 3, 2006, Pages 190-199

Ex-oxalate magnesium oxide, a strain-free nanopowder studied with diffraction line profile analysis

Author keywords

Diffraction line broadening analysis; Ex oxalate MgO; Integral breadth method; Nanocrystalline magnesium oxide; Strain free magnesium oxide

Indexed keywords

DIFFRACTION LINE BROADENING; INTEGRAL BREADTH METHODS; MGO; NANOCRYSTALLINES; STRAIN-FREE;

EID: 33748353418     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.2208089     Document Type: Article
Times cited : (9)

References (58)
  • 1
    • 0000420617 scopus 로고    scopus 로고
    • X-ray diffraction study of the early stages of the growth of nanoscale zinc oxide crystallites obtained form thermal decomposition of four precursors. General concepts on precursor-dependent microstructural properties
    • Audebrand, N., Auffrédic, J.-P., and Louër, D. (1998). "X-ray diffraction study of the early stages of the growth of nanoscale zinc oxide crystallites obtained form thermal decomposition of four precursors. General concepts on precursor-dependent microstructural properties," Chem. Mater. 10, 2450-2461.
    • (1998) Chem. Mater. , vol.10 , pp. 2450-2461
    • Audebrand, N.1    Auffrédic, J.-P.2    Louër, D.3
  • 2
    • 0343605258 scopus 로고    scopus 로고
    • An X-ray powder diffraction study of the microstructure and growth kinetics of nanoscale crystallites obtained form hydrated cerium oxides
    • Audebrand, N., Auffrédic, J.-P., and Louër, D. (2000). "An X-ray powder diffraction study of the microstructure and growth kinetics of nanoscale crystallites obtained form hydrated cerium oxides," Chem. Mater. 12, 1791-1799.
    • (2000) Chem. Mater. , vol.12 , pp. 1791-1799
    • Audebrand, N.1    Auffrédic, J.-P.2    Louër, D.3
  • 3
    • 17644430768 scopus 로고    scopus 로고
    • The microstructure of nanocrystalline powders from line profile analysis
    • Audebrand, N. and Louër, D. (2004). "The microstructure of nanocrystalline powders from line profile analysis," Mater. Sci. Forum 443-444, 71-76.
    • (2004) Mater. Sci. Forum , vol.443-444 , pp. 71-76
    • Audebrand, N.1    Louër, D.2
  • 5
    • 0029255064 scopus 로고
    • Early stages of crystallite growth of ZnO obtained from an oxalate precursor
    • Auffrédic, J.-P., Boultif, A., Langford, J. L, and Louër, D. (1995). "Early stages of crystallite growth of ZnO obtained from an oxalate precursor," J. Am. Ceram. Soc. 78, 323-328.
    • (1995) J. Am. Ceram. Soc. , vol.78 , pp. 323-328
    • Auffrédic, J.-P.1    Boultif, A.2    Langford, J.L.3    Louër, D.4
  • 6
    • 0023434845 scopus 로고
    • Controlled microstructural properties of zinc oxide powder formed by the thermal decomposition of zinc hydroxynitrate
    • Auffrédic, J. P. and Louër, D. (1987). "Controlled microstructural properties of zinc oxide powder formed by the thermal decomposition of zinc hydroxynitrate," React. Solids 4, 105-115.
    • (1987) React. Solids , vol.4 , pp. 105-115
    • Auffrédic, J.P.1    Louër, D.2
  • 7
    • 0002029775 scopus 로고    scopus 로고
    • Voigt function model in diffraction-line broadening analysis
    • edited by R. L. Snyder, J. Fiala, and H. J. Bunge (IUCr/OUP, Oxford)
    • Balzar, D. (1999). "Voigt function model in diffraction-line broadening analysis," in Defect and Microstructure Analysis by Diffraction, edited by R. L. Snyder, J. Fiala, and H. J. Bunge (IUCr/OUP, Oxford), pp. 94-126.
    • (1999) Defect and Microstructure Analysis by Diffraction , pp. 94-126
    • Balzar, D.1
  • 9
    • 0002527034 scopus 로고    scopus 로고
    • Reliability of the simplified integralbreadth methods in diffraction line-broadening analysis
    • Balzar, D. and Popovic, S. (1996). "Reliability of the simplified integralbreadth methods in diffraction line-broadening analysis," J. Appl. Crystallogr. 29, 16-23.
    • (1996) J. Appl. Crystallogr. , vol.29 , pp. 16-23
    • Balzar, D.1    Popovic, S.2
  • 10
    • 0002627514 scopus 로고
    • Raies de Debye-Scherrer et répartition des dimensions des domaines de Bragg dans les poudres polycristallines
    • Bertaut, E. F. (1950). "Raies de Debye-Scherrer et répartition des dimensions des domaines de Bragg dans les poudres polycristallines," Acta Crystallogr. 3, 14-18.
    • (1950) Acta Crystallogr. , vol.3 , pp. 14-18
    • Bertaut, E.F.1
  • 11
    • 0006403636 scopus 로고
    • Sur la correction de la transformée de Fourier d'une raie de Debye-Scherrer dans la mesure de dimensions cristallines
    • Bertaut, E. F. (1952). "Sur la correction de la transformée de Fourier d'une raie de Debye-Scherrer dans la mesure de dimensions cristallines," Acta Crystallogr. 5, 117-121.
    • (1952) Acta Crystallogr. , vol.5 , pp. 117-121
    • Bertaut, E.F.1
  • 12
    • 12444272525 scopus 로고
    • Adsorption of gases in multimolecular layers
    • Brunauer, S., Emmett, P. H., and Teller, E. (1938). "Adsorption of gases in multimolecular layers," J. Am. Chem. Soc. 60, 309-319.
    • (1938) J. Am. Chem. Soc. , vol.60 , pp. 309-319
    • Brunauer, S.1    Emmett, P.H.2    Teller, E.3
  • 14
    • 0002690488 scopus 로고
    • Crystal imperfection broadening and peak shape in the Rietveld method
    • edited by R. A. Young (IUCr/OUP, Oxford)
    • Delhez, R., de Keijser, Th. H., Langford, J. I., Louër, D., Mittemeijer, E. J., and Sonneveld, E. J. (1993). "Crystal imperfection broadening and peak shape in the Rietveld method," in The Rietveld Method, edited by R. A. Young (IUCr/OUP, Oxford), pp. 132-166.
    • (1993) The Rietveld Method , pp. 132-166
    • Delhez, R.1    De Keijser, Th.H.2    Langford, J.I.3    Louër, D.4    Mittemeijer, E.J.5    Sonneveld, E.J.6
  • 17
    • 84996245852 scopus 로고
    • X-ray line broadening as a measure of crystallite size in oxide powders
    • Guilliatt, I. F. and Brett, N. H. (1970). "X-ray line broadening as a measure of crystallite size in oxide powders," Philos. Mag. 21, 671-680.
    • (1970) Philos. Mag. , vol.21 , pp. 671-680
    • Guilliatt, I.F.1    Brett, N.H.2
  • 19
    • 29144459810 scopus 로고    scopus 로고
    • X-ray diffraction analyses of 3D MgO-based replicas of diatom microshells synthesized by a low-temperature gas/solid displacement reaction
    • Haluska, M. S., Dragomir, I. C., Sandhage, K. H., and Snyder, R. L. (2005). "X-ray diffraction analyses of 3D MgO-based replicas of diatom microshells synthesized by a low-temperature gas/solid displacement reaction," Powder Diffr. 20, 306-310.
    • (2005) Powder Diffr. , vol.20 , pp. 306-310
    • Haluska, M.S.1    Dragomir, I.C.2    Sandhage, K.H.3    Snyder, R.L.4
  • 20
    • 0003495856 scopus 로고    scopus 로고
    • International Centre for Diffraction Data, edited by Frank McClune, 12 Campus Boulevard, Newtown Square, Pennsylvania, 19073-3272
    • ICDD (2004). "Powder Diffraction File," International Centre for Diffraction Data, edited by Frank McClune, 12 Campus Boulevard, Newtown Square, Pennsylvania, 19073-3272.
    • (2004) Powder Diffraction File
  • 22
    • 0001461385 scopus 로고
    • Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening
    • Keijser de, Th. H., Langford, J. I., Mittemeijer, E. J., and Vogels, A. B. P. (1982). "Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening," J. Appl. Crystallogr. 15, 308-314.
    • (1982) J. Appl. Crystallogr. , vol.15 , pp. 308-314
    • De Keijser, Th.H.1    Langford, J.I.2    Mittemeijer, E.J.3    Vogels, A.B.P.4
  • 23
    • 0002965536 scopus 로고
    • A rapid method for analyzing the breadths of diffraction and spectral lines using the Voigt function
    • Langford, J. I. (1978). "A rapid method for analyzing the breadths of diffraction and spectral lines using the Voigt function," J. Appl. Crystallogr. 11, 10-14.
    • (1978) J. Appl. Crystallogr. , vol.11 , pp. 10-14
    • Langford, J.I.1
  • 24
    • 0001185753 scopus 로고
    • The use of the Voigt function in determining microstructural properties from diffraction data by means of pattern decomposition
    • edited by E. Prince and J. K. Stalick Spec. Publ. 846 (NIST, Gaithersburg, MD)
    • Langford, J. I. (1992). "The use of the Voigt function in determining microstructural properties from diffraction data by means of pattern decomposition," in Accuracy in Powder Diffraction II, edited by E. Prince and J. K. Stalick Spec. Publ. 846 (NIST, Gaithersburg, MD), pp. 110-126.
    • (1992) Accuracy in Powder Diffraction II , pp. 110-126
    • Langford, J.I.1
  • 25
    • 0027544935 scopus 로고
    • The use of pattern decomposition to study the combined X-ray diffraction effects of crystal size and stacking-faults in ex-oxalate zinc oxide
    • Langford, J. I., Boultif, A., Auffrédic, J. P., and Louër, D. (1993). "The use of pattern decomposition to study the combined X-ray diffraction effects of crystal size and stacking-faults in ex-oxalate zinc oxide," J. Appl. Crystallogr. 26, 22-33.
    • (1993) J. Appl. Crystallogr. , vol.26 , pp. 22-33
    • Langford, J.I.1    Boultif, A.2    Auffrédic, J.P.3    Louër, D.4
  • 26
    • 0024124695 scopus 로고
    • Profile analysis for microcrystalline properties by the Fourier and other methods
    • Langford, J. L, Delhez, R., De Keijser, Th. H., and Mittemeijer, E. J. (1988). "Profile analysis for microcrystalline properties by the Fourier and other methods," Aust. J. Phys. 41, 173-187.
    • (1988) Aust. J. Phys. , vol.41 , pp. 173-187
    • Langford, J.L.1    Delhez, R.2    De Keijser, Th.H.3    Mittemeijer, E.J.4
  • 28
    • 0001589990 scopus 로고
    • Extracting structure factors from powder diffraction data by iterating full pattern profile fitting
    • edited by E. Prince and J. K. Stalick, Spec. Publ. 846 (NIST, Gaithersburg, MD)
    • Le Bail, A. (1992). "Extracting structure factors from powder diffraction data by iterating full pattern profile fitting," in Accuracy in Powder Diffraction II, edited by E. Prince and J. K. Stalick, Spec. Publ. 846 (NIST, Gaithersburg, MD).
    • (1992) Accuracy in Powder Diffraction II
    • Le Bail, A.1
  • 29
    • 0002656920 scopus 로고
    • Smoothing and validity of crystallite-size distributions from X-ray line-profile analysis
    • Le Bail, A. and Louër, D. (1978). "Smoothing and validity of crystallite-size distributions from X-ray line-profile analysis," J. Appl. Crystallogr. 11, 50-55.
    • (1978) J. Appl. Crystallogr. , vol.11 , pp. 50-55
    • Le Bail, A.1    Louër, D.2
  • 30
    • 84977696313 scopus 로고
    • X-ray strain analysis of MgO crystallites derived from thermal decomposition of various magnesium compounds
    • Librant, Z. and Pampuch, R. (1968). "X-ray strain analysis of MgO crystallites derived from thermal decomposition of various magnesium compounds," J. Am. Ceram. Soc. 51, 109-110.
    • (1968) J. Am. Ceram. Soc. , vol.51 , pp. 109-110
    • Librant, Z.1    Pampuch, R.2
  • 31
    • 0012632153 scopus 로고
    • Applications of profile analysis for micro-crystalline properties from total pattern fitting
    • Louër, D. (1994). "Applications of profile analysis for micro-crystalline properties from total pattern fitting," Adv. X-Ray Anal. 37, 27-35.
    • (1994) Adv. X-ray Anal. , vol.37 , pp. 27-35
    • Louër, D.1
  • 32
    • 0001856349 scopus 로고    scopus 로고
    • Use of pattern decomposition to study microstructure: Practical aspects and applications
    • edited by R. L. Snyder, J. Fiala, and H. J. Bunge (IUCr/OUP, Oxford)
    • Louër, D. (1999). "Use of pattern decomposition to study microstructure: practical aspects and applications," in Defect and Microstructure Analysis by Diffraction, edited by R. L. Snyder, J. Fiala, and H. J. Bunge (IUCr/OUP, Oxford), pp. 673-697.
    • (1999) Defect and Microstructure Analysis by Diffraction , pp. 673-697
    • Louër, D.1
  • 33
    • 0000186623 scopus 로고    scopus 로고
    • Profile fitting and diffraction line-broadening analysis
    • Louër, D. and Audebrand, N. (1999). "Profile fitting and diffraction line-broadening analysis," Adv. X-Ray Anal. 41, 556-565.
    • (1999) Adv. X-ray Anal. , vol.41 , pp. 556-565
    • Louër, D.1    Audebrand, N.2
  • 34
    • 0001719893 scopus 로고
    • A precise determination of the shape, size and distribution of size of crystallites in zinc oxide by X-ray line broadening analysis
    • Louër, D., Auffrédic, J. P., Langford, J. I., Ciosmak, D., and Niepce, J. C. (1983). "A precise determination of the shape, size and distribution of size of crystallites in zinc oxide by X-ray line broadening analysis," J. Appl. Crystallogr. 16, 183-191.
    • (1983) J. Appl. Crystallogr. , vol.16 , pp. 183-191
    • Louër, D.1    Auffrédic, J.P.2    Langford, J.I.3    Ciosmak, D.4    Niepce, J.C.5
  • 35
    • 0036959030 scopus 로고    scopus 로고
    • A study of nanocrystalline yttrium oxide from diffraction-line-profile analysis: Comparison of methods and crystallite growth
    • Louër, D., Bataille, T., Roisnel, T., and Rodriguez-Carvajal, J. (2002). "A study of nanocrystalline yttrium oxide from diffraction-line- profile analysis: comparison of methods and crystallite growth," Powder Diffr. 17, 262-269.
    • (2002) Powder Diffr. , vol.17 , pp. 262-269
    • Louër, D.1    Bataille, T.2    Roisnel, T.3    Rodriguez-Carvajal, J.4
  • 36
    • 0000877193 scopus 로고
    • Peak shape and resolution in conventional diffractometry with monochromatic X-rays
    • Louër, D. and Langford, J. I. (1988). "Peak shape and resolution in conventional diffractometry with monochromatic X-rays," J. Appl. Crystallogr. 21, 430-437.
    • (1988) J. Appl. Crystallogr. , vol.21 , pp. 430-437
    • Louër, D.1    Langford, J.I.2
  • 37
    • 0021393350 scopus 로고
    • X-ray diffraction line broadening of cadmium oxide produced by cadmium hydroxide decomposition
    • Louër, D., Mesnier, M. T., and Niepce, J. C. (1984a). "X-ray diffraction line broadening of cadmium oxide produced by cadmium hydroxide decomposition," J. Mater. Sci. 19, 716-722.
    • (1984) J. Mater. Sci. , vol.19 , pp. 716-722
    • Louër, D.1    Mesnier, M.T.2    Niepce, J.C.3
  • 38
    • 0021372833 scopus 로고
    • Morphological analysis and growth of crystallites during the annealing of ZnO
    • Louër, D., Vargas, R., and Auffrédic, J.-P. (1984b). "Morphological analysis and growth of crystallites during the annealing of ZnO," J. Am. Ceram. Soc. 67, 136-141.
    • (1984) J. Am. Ceram. Soc. , vol.67 , pp. 136-141
    • Louër, D.1    Vargas, R.2    Auffrédic, J.-P.3
  • 39
    • 0016516185 scopus 로고
    • Texture and sinterability of MgO powders
    • Pampuch, R., Librant, Z., and Piekarczyk, J. (1975). "Texture and sinterability of MgO powders," Ceram. Int. 1, 14-18.
    • (1975) Ceram. Int. , vol.1 , pp. 14-18
    • Pampuch, R.1    Librant, Z.2    Piekarczyk, J.3
  • 40
    • 33748356589 scopus 로고    scopus 로고
    • Development of MgO ceramic standards for X-ray and neutron line broadening assessments
    • Pratapa, S. and O'Connor, B. (2002). "Development of MgO ceramic standards for X-ray and neutron line broadening assessments," Adv. X-Ray Anal. 45, 41-47.
    • (2002) Adv. X-ray Anal. , vol.45 , pp. 41-47
    • Pratapa, S.1    O'Connor, B.2
  • 41
    • 0036213541 scopus 로고    scopus 로고
    • A comparative study of single-line and Rietveld strain-size evaluation procedures using MgO ceramics
    • Pratapa, S., O'Connor, B., and Hunter, B. (2002). "A comparative study of single-line and Rietveld strain-size evaluation procedures using MgO ceramics," J. Appl. Crystallogr. 35, 155-162.
    • (2002) J. Appl. Crystallogr. , vol.35 , pp. 155-162
    • Pratapa, S.1    O'Connor, B.2    Hunter, B.3
  • 42
    • 0001993081 scopus 로고
    • FULLPROF: A program for Rietveld refinement and pattern matching analysis
    • Toulouse, France
    • Rodriguez-Carvajal, J. (1990). "FULLPROF: a program for Rietveld refinement and pattern matching analysis," Abstracts of the meeting Powder Diffraction, Toulouse, France, 127-128. (FULLPROF is available at http://www-llb.cea.fr/fullweb/powder.htm).
    • (1990) Abstracts of the Meeting Powder Diffraction , pp. 127-128
    • Rodriguez-Carvajal, J.1
  • 43
    • 0012685743 scopus 로고    scopus 로고
    • Recent developments of the program FULLPROF
    • December 2001
    • Rodriguez-Carvajal, J. (2001). "Recent developments of the program FULLPROF," IUCr-CPD NewsLetter 26, December 2001, 12-19.
    • (2001) IUCr-CPD NewsLetter , vol.26 , pp. 12-19
    • Rodriguez-Carvajal, J.1
  • 44
    • 0842326602 scopus 로고    scopus 로고
    • Line broadening analysis using FULLPROF: Determination of microstructural properties
    • Rodriguez-Carvajal, J. and Roisnel, T. (2002). "Line broadening analysis using FULLPROF: determination of microstructural properties," Mater. Sci. Forum 443-444, 123-126.
    • (2002) Mater. Sci. Forum , vol.443-444 , pp. 123-126
    • Rodriguez-Carvajal, J.1    Roisnel, T.2
  • 45
    • 0035184477 scopus 로고    scopus 로고
    • WinPLOTR: A windows tool for powder diffraction pattern analysis
    • Roisnel, T. and Rodriguez-Carvajal, J. (2001). "WinPLOTR: a windows tool for powder diffraction pattern analysis," Mater. Sci. Forum 378-381, 118-123.
    • (2001) Mater. Sci. Forum , vol.378-381 , pp. 118-123
    • Roisnel, T.1    Rodriguez-Carvajal, J.2
  • 47
    • 0000345778 scopus 로고
    • A numerical Fourier-analysis method for the correction of widths and shapes of lines on X-ray powder photographs
    • Stokes, A. R. (1948). "A numerical Fourier-analysis method for the correction of widths and shapes of lines on X-ray powder photographs," Proc. Phys. Soc. London 61, 382-391.
    • (1948) Proc. Phys. Soc. London , vol.61 , pp. 382-391
    • Stokes, A.R.1
  • 48
    • 33645936110 scopus 로고
    • The diffraction of X-rays by distorted crystal aggregates-I
    • Stokes, A. R. and Wilson, A. J. C. (1944). "The diffraction of X-rays by distorted crystal aggregates-I," Proc. Phys. Soc. London 56, 174-181.
    • (1944) Proc. Phys. Soc. London , vol.56 , pp. 174-181
    • Stokes, A.R.1    Wilson, A.J.C.2
  • 51
    • 0001456546 scopus 로고
    • Diffraction line profiles and Scherrer constants for materials with hexagonal crystallites
    • Vargas, R., Louër, D., and Langford, J. I. (1983). "Diffraction line profiles and Scherrer constants for materials with hexagonal crystallites," J. Appl. Crystallogr. 16, 512-518.
    • (1983) J. Appl. Crystallogr. , vol.16 , pp. 512-518
    • Vargas, R.1    Louër, D.2    Langford, J.I.3
  • 52
    • 0001909421 scopus 로고
    • Analysis of the broadening of powder pattern peaks from cold-worked face-centered and body-centered cubic metals
    • Wagner, C. N. J. and Aqua, E. N. (1964). "Analysis of the broadening of powder pattern peaks from cold-worked face-centered and body-centered cubic metals," Adv. X-Ray Anal. 7, 46-65.
    • (1964) Adv. X-ray Anal. , vol.7 , pp. 46-65
    • Wagner, C.N.J.1    Aqua, E.N.2
  • 53
    • 36849121133 scopus 로고
    • The effect of cold-work distortion on X-ray patterns
    • Warren, B. E. and Averbach, B. L. (1950). "The effect of cold-work distortion on X-ray patterns," J. Appl. Phys. 21, 595-599.
    • (1950) J. Appl. Phys. , vol.21 , pp. 595-599
    • Warren, B.E.1    Averbach, B.L.2
  • 54
    • 36849120280 scopus 로고
    • The separation of cold-work distortion and particle size broadening in X-ray patterns
    • Warren, B. E. and Averbach, B. L. (1952). "The separation of cold-work distortion and particle size broadening in X-ray patterns," J. Appl. Phys. 23, 497.
    • (1952) J. Appl. Phys. , vol.23 , pp. 497
    • Warren, B.E.1    Averbach, B.L.2
  • 56
    • 0002450903 scopus 로고
    • Introduction to the Rietveld method
    • edited by R. A. Young (IUCr/OUP, Oxford)
    • Young, R. A. (1993). "Introduction to the Rietveld method," in The Rietveld Method, edited by R. A. Young (IUCr/OUP, Oxford), pp. 1-38.
    • (1993) The Rietveld Method , pp. 1-38
    • Young, R.A.1
  • 57
    • 0003125150 scopus 로고
    • Crystallite size and microstrain indicators in Rietveld refinement
    • Young, R. A. and Desai, P. (1989). "Crystallite size and microstrain indicators in Rietveld refinement," Ark. Mat. 10, 71-90.
    • (1989) Ark. Mat. , vol.10 , pp. 71-90
    • Young, R.A.1    Desai, P.2
  • 58
    • 0001459433 scopus 로고
    • Propagation of some systematic errors in X-ray line profile analysis
    • Young, R. A., Gerdes, R. G., and Wilson, A. J. C. (1967). "Propagation of some systematic errors in X-ray line profile analysis," Acta Crystallogr. 22, 155-162.
    • (1967) Acta Crystallogr. , vol.22 , pp. 155-162
    • Young, R.A.1    Gerdes, R.G.2    Wilson, A.J.C.3


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