Diffraction-line broadening due to strain fields in materials; fundamental aspects and methods of analysis

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 52, Issue 5, 1996, Pages 730-747

  Van Berkum, J G M ^a,b   Delhez, R ^a   De Keijser, Th H ^a   Mittemeijer, E J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000344888     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767396005727     Document Type: Article

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