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Volumn 12, Issue 2-3, 2004, Pages 155-176

Thin-film solar cells: Device measurements and analysis

Author keywords

Admittance; Amorphous Si; CdTe; Cu(InGa)Se2; Quantum efficiency; Thin film

Indexed keywords

AMORPHOUS SILICON; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC ADMITTANCE; ELECTRIC VARIABLES MEASUREMENT; PHOTOCURRENTS; QUANTUM EFFICIENCY; SEMICONDUCTING CADMIUM TELLURIDE; THIN FILMS;

EID: 1842731047     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/pip.518     Document Type: Article
Times cited : (1055)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.