Material-induced shunts in multicrystalline silicon solar cells

Semiconductors

Volumn 41, Issue 4, 2007, Pages 440-443

  Breitenstein, O ^a   Bauer, J ^a   Rakotoniaina, J P ^b  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b Q Cells AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34247617309     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/S106378260704015X     Document Type: Article

References (9)

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3. O. Breitenstein and M. Langenkamp, Lock-in Thermography - Basics and Applications to Functional Diagnostics of Electronic Components (Springer, Heidelberg, 2003), ISBN 3-540-43439-9.
4. O. Breitenstein, J. P. Rakotoniaina, M. H. Al Rifai, and M. Werner, Prog. Photovoltaics: Res. Appl. 12, 529 (2004).
5. J. Marek, J. Appl. Phys. 55, 1621 (1984).
6. SEM Microcharacterization of Semiconductors, Ed. by D. B. Holt and D. C. Joy (Academic, London, 1989).
7. J. P. Rakotoniaina, S. Neve, M. Werner, and O. Breitenstein, in Proceedings of Conference and Exhibition on PV in Europe: From PV Technology to Energy Solutions (Rome, 2002), p. 24.
8. J. Bauer, Diploma Thesis (Martin-Luther-Univ., Halle, Germany, 2006) [in Proceedings of EDS Conference, Halle, Germany, 2006 (in press)].
9. A. Grohe, U. Zastrow, D. Meertens, et al., in Proceedings of 20th European Photovoltaic Solar Energy Conference (Barcelona, 2005), p. 1158.