Characterisation of molecular orientation in organic nanomaterials by X-ray Linear Dichroism Microscopy

International Journal of Nanotechnology

Volumn 5, Issue 9-12, 2008, Pages 1138-1170

  Urquhart, Stephen G ^a   Lanke, Uday D ^a,b   Fu, Juxia ^a,c  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

^b CANADIAN LIGHT SOURCE INC   (Canada)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Linear dichroism; NEXAFS; STXM; X PEEM; X ray microscopy; XANES; XLDM

Indexed keywords

CHEMICAL ANALYSIS; DICHROISM; IMAGE RESOLUTION; LIGHT SOURCES; MULTILAYERS; NANOSTRUCTURED MATERIALS; X RAY ABSORPTION; X RAY MICROSCOPES; X RAYS;

LINEAR DICHROISM; NEXAFS; STXM; X RAY MICROSCOPY; X-PEEM; XANES; XLDM;

MOLECULAR ORIENTATION;

EID: 49449107148     PISSN: 14757435     EISSN: None     Source Type: Journal    
DOI: 10.1504/IJNT.2008.019835     Document Type: Article

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