-
3
-
-
0345327013
-
-
PhD thesis, State University of New York at Stony Brook, New York
-
Wang Y (1998) PhD thesis, State University of New York at Stony Brook, New York
-
(1998)
-
-
Wang, Y.1
-
4
-
-
0001809059
-
-
Winn B, Ade H, Buckley C, Howells M, Hulbert S, Jacobsen C, Kirz J, McNulty I, Miao J, Oversluizen T, Pogorelsky I, Wirick S (1996) Rev Sci Instrum 67:1
-
(1996)
Rev Sci Instrum
, vol.67
, pp. 1
-
-
Winn, B.1
Ade, H.2
Buckley, C.3
Howells, M.4
Hulbert, S.5
Jacobsen, C.6
Kirz, J.7
McNulty, I.8
Miao, J.9
Oversluizen, T.10
Pogorelsky, I.11
Wirick, S.12
-
5
-
-
0026260878
-
-
Jacobsen C, Williams S, Anderson E, Browne MT, Buckley CJ, Kern D, Kirz J, Rivers M, Zhang X (1991) Opt Commun 86:351
-
(1991)
Opt Commun
, vol.86
, pp. 351
-
-
Jacobsen, C.1
Williams, S.2
Anderson, E.3
Browne, M.T.4
Buckley, C.J.5
Kern, D.6
Kirz, J.7
Rivers, M.8
Zhang, X.9
-
6
-
-
0039233748
-
-
Aristov VV, Erko AI (eds), Bogorodskii Pechatnik Publishing Company, Chernogolovka, Moscow, Russia
-
Jacobsen C, Anderson E, Chapman H, Kirz J, Lindaas S, Rivers M, Wang S, Williams S, Wirick S, Zhang W (1993) In: Aristov VV, Erko AI (eds) Proceedings of the 4th International Conference X-ray microscopy IV, Bogorodskii Pechatnik Publishing Company, Chernogolovka, Moscow, Russia, pp 304-321
-
(1993)
Proceedings of the 4th International Conference X-ray Microscopy IV
, vol.4
, pp. 304-321
-
-
Jacobsen, C.1
Anderson, E.2
Chapman, H.3
Kirz, J.4
Lindaas, S.5
Rivers, M.6
Wang, S.7
Williams, S.8
Wirick, S.9
Zhang, W.10
-
7
-
-
26544438604
-
-
Thieme J, Schmahl G, Umbach E, Rudolph D (eds), Springer, Berlin Heidelberg New York
-
Spector S, Jacobsen C, Tennant D (1998) In: Thieme J, Schmahl G, Umbach E, Rudolph D (eds), X-ray microscopy and spectromicroscopy. Springer, Berlin Heidelberg New York, p IV-13
-
(1998)
X-ray Microscopy and Spectromicroscopy
-
-
Spector, S.1
Jacobsen, C.2
Tennant, D.3
-
9
-
-
0027113912
-
-
Ade H, Zhang X, Cameron S, Costello C, Kirz J, Williams S (1992) Science 258:972
-
(1992)
Science
, vol.258
, pp. 972
-
-
Ade, H.1
Zhang, X.2
Cameron, S.3
Costello, C.4
Kirz, J.5
Williams, S.6
-
12
-
-
0000736827
-
-
Attwood DT, Henke BL (eds). American Institute of Physics, Monterey
-
Henke BL (1981) In: Attwood DT, Henke BL (eds) Low energy X-ray diagnostics; vol 75. American Institute of Physics, Monterey, pp 146-155
-
(1981)
Low Energy X-ray Diagnostics
, vol.75
, pp. 146-155
-
-
Henke, B.L.1
-
17
-
-
0011704923
-
-
Buckley CJ, Bellamy SJ, Zhang X, Dermody G, Hulbert S (1995) Rev Sci Instrum 66:1322
-
(1995)
Rev Sci Instrum
, vol.66
, pp. 1322
-
-
Buckley, C.J.1
Bellamy, S.J.2
Zhang, X.3
Dermody, G.4
Hulbert, S.5
-
20
-
-
0028698383
-
-
Niemeyer J, Thieme J, Guttman P, Wilhein T, Rudolph D, Schmahl G (1994) Prog Colloid Polym Sci 95:139
-
(1994)
Prog Colloid Polym Sci
, vol.95
, pp. 139
-
-
Niemeyer, J.1
Thieme, J.2
Guttman, P.3
Wilhein, T.4
Rudolph, D.5
Schmahl, G.6
-
23
-
-
4243577140
-
-
Thieme J, Schmahl G, Umbach E, Rudolph D (eds). Springer, Berlin Heidelberg New York
-
Schneider G, Niemann B (1998). In: Thieme J, Schmahl G, Umbach E, Rudolph D (eds) X-ray microscopy and spectromicroscopy. Springer, Berlin Heidelberg New York, p I-15
-
(1998)
X-ray Microscopy and Spectromicroscopy
-
-
Schneider, G.1
Niemann, B.2
-
24
-
-
26544472812
-
-
Thieme J, Schmahl G, Umbach E, Rudolph D (eds). Springer, Berlin Heidelberg New York
-
Maser J, Jacobsen C, Osanna A, Wang S, Kalinovsky A, Kirz J, Spector S, Warnking J (1998) In: Thieme J, Schmahl G, Umbach E, Rudolph D (eds) X-ray microscopy and spectromicroscopy. Springer, Berlin Heidelberg New York, p I-35
-
(1998)
X-ray Microscopy and Spectromicroscopy
-
-
Maser, J.1
Jacobsen, C.2
Osanna, A.3
Wang, S.4
Kalinovsky, A.5
Kirz, J.6
Spector, S.7
Warnking, J.8
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