X-PEEM study on surface orientation of stylized and rubbed polyimides

Macromolecules

Volumn 31, Issue 15, 1998, Pages 4957-4962

  Cossy Favre, A ^a,e   Diaz J ^a   Liu, Y ^b   Brown, H R ^c   Samant, M G ^d   Stohr J ^d   Hanna, A J ^a   Anders, S ^a   Russell, T P ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF MASSACHUSETTS   (United States)

^c UNIVERSITY OF WOLLONGONG   (Australia)

^d IBM ALMADEN RESEARCH CENTER   (United States)

^e SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; INTERFACES (MATERIALS); MOLECULAR ORIENTATION; SURFACE STRUCTURE; SYNCHROTRON RADIATION; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY; YIELD STRESS;

NEAR-EDGE XRAY ABSORPTION FINE STRUCTURE; RUBBING; SURFACE ORIENTATION; X RAY PHOTOELECTRON EMISSION MICROSCOPY;

POLYIMIDES;

EID: 0032118198     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma980029b     Document Type: Article

References (26)

1. Depp, S. W.; Howard, W. E. Sci. Am. 1993, 268, 90.
2. Geary, J. M.; Goodby, J. W.; Kmetz, A. R.; Patel J. S. J. Appl. Phys. 1987, 62, 4100.
3. Van Aerle, N. A. J. M.; Barmentlo, M.; Hollering, R. W. J. J. Appl. Phys. 1993, 74, 3111.
4. Berreman, D. W. Phys. Rev. Lett. 1972, 28, 1683.
5. Castellano, J. A. Mol. Cryst. Liq. Cryst. 1983, 94, 33.
6. Toney, M. F.; Russell, T. P.; Logan, J. A.; Kikuchi, H.; Sands, J. M.; Kumar S. K. Nature 1995, 374, 709.
7. Reiter, G. Europhys. Lett. 1993, 23, 579.
8. Keddie, J. L.; Jones, R. A. L.; Gory, R. A. Europhys. Lett. 1994, 27, 59.
9. Orts, W. J.; van Zanten, J. H.; Wu, W. L.; Satija, S. K. Phys. Rev. Lett. 1993, 71, 867.
10. Kajiyama, T.; Tanaka, K.; Takahara, A. Macromolecules 1997, 30, 280.
11. Brown, H. R.; Russell, T. P. Macromolecules 1996, 29, 798.
12. Meyers, G. F.; DeKoven, B. M.; Seitz, J. T. Langmuir, 1992, 8, 2330.
13. Ade, H.; Hsiao, B. Science 1993, 262, 1427.
14. Samant, M. G.; Stöhr, J.; Brown, H. R.; Russell, T. P.; Sands, J. M.; Kumar, S. K. Macromolecules 1996, 29, 8334.
15. Ade, H.; Zhang, X.; Cameron, S.; Costello, C.; Kirz, J.; Williams, S. Science 1992, 258, 972.
16. Cossy-Favre, A.; Diaz, J.; Anders, S.; Padmore, H. A.; Liu, Y.; Samant, M. G., Stöhr, J.; Brown, H. R.; Russell, T. P. Acta Phys. Polonica A 1997, 91, 923.
17. Stöhr, J. NEXAFS Spectroscopy; Springer Series in Surface Sciences 25; Springer: Berlin, 1992.
18. Kikuchi, H.; Logan, J. A. Yoon, D. Y. J. Appl. Phys. 1996, 79, 6811.
19. Harp, G.; Tonner, B. P. Proc. Mater. Res. Soc. 1989, 143, 279.
20. Ree, M.; Yoon, D. Y.; Depero, L. E.; Parish, W. Manuscript in preparation.
21. Tonner, B. P.; Dunham, D.; Droubay, T.; Pauli, M. J. Electron Spectrosc. Relat. Phenom. 1997, 84, 211.
22. Engel, W.; Kordesch, M. E.; Rotermund, H. H.; Kubala, S.; von Oertzen, A. Ultramicroscopy 1991, 36, 148.
23. Hertz, H. Miscellaneous Papers; Macmillan: London, 1896, p 146.
24. Johnson, K. L.; Kendall, K.; Roberts, A. D. Proc. R. Soc. London 1971, A 324, 301.
25. Johnson, K. L. Contact Mechanics; Cambridge University Press: Cambridge, England, 1985.
26. Greenwood, J. A.; Williamson, J. B. Proc. R. Soc. London 1966, A295, 300.