Soft X-ray microscopy and spectroscopy at the molecular environmental science beamline at the Advanced Light Source

Journal of Electron Spectroscopy and Related Phenomena

Volumn 150, Issue 2-3, 2006, Pages 86-104

  Bluhm, H ^a   Andersson, K ^b,c   Araki, T ^d   Benzerara, K ^e,l   Brown, G E ^b,e   Dynes, J J ^d   Ghosal, S ^a,f   Gilles, M K ^a   Hansen, H Ch ^g   Hemminger, J C ^f   Hitchcock, A P ^d   Ketteler, G ^a   Kilcoyne, A L D ^a   Kneedler, E ^h   Lawrence, J R ⁱ   Leppard, G G ⁱ   Majzlam, J ^j   Mun, B S ^a   Myneni, S C B ^j   Nilsson, A ^b,c   Ogasawara, H ^b   Ogletree, D F ^a   Pecher, K ^k   Salmeron, M ^a   Shuh, D K ^a   Tonner, B ^k   Tyliszczak, T ^a   Warwick, T ^a   Yoon, T H ^e,m   more..

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^c STOCKHOLM UNIVERSITY   (Sweden)

^d MCMASTER UNIVERSITY   (Canada)

^e STANFORD UNIVERSITY   (United States)

^f UNIVERSITY OF CALIFORNIA   (United States)

^g UNIVERSITY OF COPENHAGEN   (Denmark)

^h Thermo Fisher Scientific   (United States)

ⁱ ENVIRONMENT CANADA   (Canada)

^j PRINCETON UNIVERSITY   (United States)

^k PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^l UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^m Hanyang University   (South Korea)

more..

Author keywords

Near edge X ray absorption fine structure; Scanning transmission X ray microscopy; Water environmental science; X ray emission spectroscopy; X ray photoelectron spectroscopy

Indexed keywords

MONOLAYERS; SINGLE CRYSTALS; X RAY MICROSCOPES; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY;

WATER ENVIRONMENTAL SCIENCE; X-RAY EMISSION SPECTROSCOPY;

ENVIRONMENTAL ENGINEERING;

EID: 28544453385     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.07.005     Document Type: Article

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