Characterization of adsorbate ensembles by X-ray linear dichroism microscopy

Surface Science

Volumn 464, Issue 1, 2000, Pages 8-22

  Zharnikov, M ^a   Neuber, M ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CARBOXYLIC ACIDS; CRYSTAL ORIENTATION; ELECTRON MICROSCOPY; MOLECULAR ORIENTATION; MOLECULAR STRUCTURE; MONOLAYERS; NICKEL; PHOTONS; POLYCRYSTALLINE MATERIALS; X RAY MICROSCOPES; X RAY SPECTROSCOPY;

BENZOIC ACID; NEAR-EDGE EXTENDED X RAY ABSORPTION FINE STRUCTURE (NEXAFS); PHOTOELECTRON MICROSCOPY; X RAY ABSORPTION SPECTROMICROSCOPY; X RAY LINEAR DICHROISM MICROSCOPY;

ADSORPTION;

EID: 0034274790     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00642-7     Document Type: Article

References (35)

1. Stöhr J. NEXAFS Spectroscopy. Springer Series in Surface Science. vol. 25:1992;Springer-Verlag, Heidelberg, Berlin.
2. Ade H., Hsiao B. Science. 262:1993;1427.
3. Holldack K., Grunze M. Anal. Chim. Acta. 297:1994;125.
4. Holldack K., Grunze M., Kinzler M., Kerkow H., Brundle C.R. J. Electron Spectrosc. Relat. Phenom. 73:1995;239.
5. Smith A.P., Ade H. Appl. Phys. Lett. 69:1996;3833.
6. Warwick T., Ade H., Hitchcock A.P., Padmore H., Rightor E.G., Tonner B.P. J. Electron Spectrosc. Relat. Phenom. 84:1997;85.
7. Ade H., Smith A.P., Zhang H., Thuang G.R., Kirz J., Rightor E., Hitchcock A.P. J. Electron Spectrosc. Relat. Phenom. 84:1997;53.
8. Ade H. TRIP. 5:1997;58.
9. Cossy-Favre A., Diaz J., Liu Y., Brown H.R., Samant M.G., Stöhr J., Hanna A.J., Anders S., Russel T.P. Macromolecules. 31:1998;4957.
10. C.G. Zimba, E.L. Thomas, C. Ober, in preparation.
11. Neuber M., Zharnikov M., Grunze M. Surf. Rev. Lett. 6:1999;53.
12. Zharnikov M., Neuber M., Grunze M. J. Electron Spectrosc. Relat. Phenom. 98-99:1999;25-25.
13. Frederick B.G., Jones T.S., Pudney P.D.A., Richardson N.V. J. Electron Spectrosc. Relat. Phenom. 64/65:1993;115.
14. Frederick B.G., Ashton M.R., Richardson N.V. Surf. Sci. 292:1993;33.
15. Richardson N.V., Frederick B.G., Unertl W.N., El. Farrash A. Surf. Sci. 307-309:1994;124.
16. Pemble M.E., Turner A.R., Shukla N., Bitzer T., Frederick B.G., Kitching K.J., Richardson N.V. J. Chem. Soc., Faraday Trans. 91:1995;3627.
17. Frederick B.G., Leibsle F.M., Haq S., Richardson N.V. Surf. Rev. Lett. 3:1996;1523.
18. Frederick B.G., Chen Q., Leibsle F.M., Lee M.B., Kitching K.J., Richardson N.V. Surf. Sci. 394:1997;1.
19. Adem E., Champaniera R., Coxon P. Vacuum. 41:1990;1695.
20. Coxon P., Krizek J., Humpherson M., Wardell I.R.M. J. Electron Spectrosc. Relat. Phenom. 51-52:1990;821.
21. Bernstorff S., Braun W., Mast M., Peatman W., Schröder T. Rev. Sci. Instrum. 60:1989;2097.
22. Dubois L.H., Zegarski B.R., Nuzzo R.G. Langmuir. 2:1986;412.
23. Puschmann A., Haase J., Crapper M.D., Riley C.E., Woodruff D.P. Phys. Rev. Lett. 54:1985;2250.
24. Crapper M.D., Riley C.E., Woodruff D.P., Puschmann A., Haase J. Surf. Sci. 171:1986;1.
25. Stöhr J., Gland J.L., Eberhardt W., Outka D., Madix R.J., Sette F., Koestner R.J., Döbler U. Phys. Rev. Lett. 51:1983;2414.
26. Stöhr J., Outka D., Madix R.J., Döbler U. Phys. Rev. Lett. 54:1985;1256.
27. Outka D., Madix R.J., Stöhr J. Surf. Sci. 164:1985;235.
28. Outka D., Stöhr J., Madix R.J. Surf. Sci. 185:1987;53.
29. Zharnikov M., Neuber M., Grunze M. Surf. Rev. Lett. 5:1998;1.
30. Scofield J.H. J. Electron Spectrosc. Relat. Phenom. 8:1976;129.
31. Laibinis P.E., Graham R.L., Biebuyck H.A., Whitesides G.M. Science. 254:1991;981.
32. Bauer E., Telieps W. Howie A., Valdre U. Surface and Interface Characterization by Electron Optical Methods. 1987;195 Plenum, New York.
33. Rempfer G.F., Griffith O.H. Ultramicroscopy. 47:1992;35.
34. Tonner B.P., Dunham D., Droubay T., Kikuma J., Denlinger J. J. Electron Spectrosc. Relat. Phenom. 78:1996;13.
35. Bauer E. J. Electron Spectrosc. Relat. Phenom. 84:1997;201.