Application of spectromicroscopy tools to explore local origins of sensor activity in quasi-1D oxide nanostructures

Nanotechnology

Volumn 17, Issue 16, 2006, Pages 4014-4018

  Kolmakov, A ^a   Lanke, U ^b   Karam, R ^c   Shin, J ^d   Jesse, S ^d   Kalinin, S V ^d  

^a SOUTHERN ILLINOIS UNIVERSITY   (United States)

^b CANADIAN LIGHT SOURCE INC   (Canada)

^c Invenios Inc   (United States)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL RESISTANCE; MOS DEVICES; NANOSTRUCTURED MATERIALS; SPECTROSCOPIC ANALYSIS; SURFACE REACTIONS; SYNCHROTRONS; TRANSPORT PROPERTIES;

PHOTOELECTRON EMISSION MICROSCOPY (PEEM); QUASI-1D NANOSTRUCTURE; SCANNING SURFACE POTENTIAL MICROSCOPY (SSPM); SUBMICRONS;

SENSORS;

EID: 33748904615     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/16/003     Document Type: Article

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