Automated spatial drift correction for EFTEM image series

Ultramicroscopy

Volumn 102, Issue 1, 2004, Pages 27-36

  Schaffer, Bernhard ^a   Grogger, Werner ^a   Kothleitner, Gerald ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Cross correlation; Digital filtering; EFTEM; Image registration; Spatial drift correction

Indexed keywords

CROSS-CORRELATION; ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPY (EFTEM); SCIENTIFIC RESEARCH; STATISTICALLY DETERMINED SPATIAL DRIFTS (SDSD);

ALGORITHMS; AUTOMATION; CORRELATION METHODS; DATA REDUCTION; IMAGE ANALYSIS; IONIZATION; MAPPING; RESEARCH; SCATTERING; STATISTICAL METHODS;

TRANSMISSION ELECTRON MICROSCOPY;

ALGORITHM; ARTICLE; AUTOMATION; DATA ANALYSIS; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE DISPLAY; STATISTICAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

ALGORITHMS; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ENERGY-FILTERING TRANSMISSION ELECTRON;

EID: 8844219664     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.08.003     Document Type: Article

References (22)

1. F. Hofer, P. Warbichler, and W. Grogger Ultramicroscopy 59 1995 15
2. A.J. Gubbens, and O.L. Krivanek Ultramicroscopy 51 1993 146
3. B. Freitag, and W. Mader J. Microsc. 194 1999 42
4. J. Marien, J.M. Plitzko, R. Spolenak, R.M. Keller, and J. Mayer J. Microsc. 194 1999 71
5. J.M. Plitzko, and J. Mayer Ultramicroscopy 78 1999 207
6. N. Bonnet, L. Lucas, and D. Ploton Scanning Microscopy 10 1996 85
7. A. Berger, J. Mayer, and H. Kohl Ultramicroscopy 55 1994 101
8. G. Kothleitner, and F. Hofer Ultramicroscopy 96 2003 491
9. J. Mayer, U. Eigenthaler, J.M. Plitzko, and F. Dettenwanger Micron 28 1997 361
10. P.J. Thomas, and P.A. Midgley Ultramicroscopy 88 2001 187
11. P.J. Thomas, and P.A. Midgley Ultramicroscopy 88 2001 179
12. J.-L. Lavergne, J.-M. Martin, and M. Belin Microsc. Microanal. Microstruct. 3 1992 517
13. C. Jeanguillaume, and C. Colliex Ultramicroscopy 28 1989 252
14. J.A. Hunt, and D.B. Williams Ultramicroscopy 38 1991 47
15. R.D. Leapman, and J.A. Hunt Microsc. Key Res. Tool 22 1992 39
16. L. Gottesfeld-Brown ACM Comput. Surv. 24 1992 325
17. G. Kothleitner, and F. Hofer Micron 29 1998 349
18. J.C. Russ The Image Processing Handbook fourth ed. 2002 CRC Press Boca Raton FL
19. M. Sonka, V. Hlavac, and R. Boyle Image Processing, Analysis, and Machine Vision second ed. 1998 PWS Publishing Pacific Grove, California 93950
20. K. Aoyama, R. Matsumoto, and Y. Komatsu J. Electron. Microsc. 51 2002 257
21. W. Frei, and C.-C. Chen IEEE Trans. on Comput. c-26 1977 988
22. F. Hofer, and P. Warbichler Ultramicroscopy 63 1996 21