Analysis of the test data volume reduction benefit of modular SOC testing

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2008, Pages 182-187

  Sinanoglu, Ozgur ^a   Manmssen, Erik Jan ^b  

^a KUWAIT UNIVERSITY   (Kuwait)

^b NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN OF EXPERIMENTS; IMPACT TESTING; INDUSTRIAL ENGINEERING; PROGRAMMABLE LOGIC CONTROLLERS; TEST FACILITIES; TESTING;

DATA VOLUMES; SOC TESTING; TEST PATTERNS; TEST POWER REDUCTIONS; TEST TIME; TEST-DATA VOLUME;

DATA REDUCTION;

EID: 47849112520     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2008.4484683     Document Type: Conference Paper

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