Microstructure and creep behavior of silicon nitride and SiAlONs

International Journal of Applied Ceramic Technology

Volumn 5, Issue 2, 2008, Pages 138-154

  Fox, Kevin M ^a   Hellmann, John R ^b  

^a SAVANNAH RIVER NATIONAL LABORATORY   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAVITATION; COMPRESSION TESTING; CREEP RESISTANCE; CRYSTAL MICROSTRUCTURE; GRAIN BOUNDARY SLIDING; GRAIN SIZE AND SHAPE; MICROSTRUCTURAL EVOLUTION; MORPHOLOGY;

GRAIN MORPHOLOGY; INTERGRANULAR PHASE;

SILICON NITRIDE;

EID: 41749091377     PISSN: 1546542X     EISSN: 17447402     Source Type: Journal    
DOI: 10.1111/j.1744-7402.2008.02192.x     Document Type: Article

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