Atomic Resolution Transmission Electron Microscopy of the Intergranular Structure of a Y2O3-Containing Silicon Nitride Ceramic

Journal of the American Ceramic Society

Volumn 86, Issue 10, 2003, Pages 1777-1785

  Ziegler, A ^a   Kisielowski, C ^b   Hoffmann, M J ^c   Ritchie, R O ^a  

^a Lawrence Berkeley National Laboratory   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY LAYERS; CERAMIC MATERIALS; COMPUTER SIMULATION; CRYSTAL STRUCTURE; EMISSION SPECTROSCOPY; GRAIN BOUNDARIES; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION;

YTTRIUM COMPOUNDS;

EID: 0242334617     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2003.tb03554.x     Document Type: Article

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