Redistribution of a grain-boundary glass phase during creep of silicon nitride ceramics

Journal of the American Ceramic Society

Volumn 80, Issue 3, 1997, Pages 685-691

  Jin, Qiang ^a   Ning, Xiao Guang ^a   Wilkinson, David S ^a   Weatherly, George C ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ADDITION REACTIONS; BARIUM; CREEP; CREEP TESTING; DEFORMATION; DOPING (ADDITIVES); FILMS; GLASS; GRAIN BOUNDARIES; STATISTICAL METHODS; TRANSMISSION ELECTRON MICROSCOPY; VISCOUS FLOW;

COMPRESSIVE CREEP BEHAVIOR; GRAIN BOUNDARY FILM WIDTH MEASUREMENT; HIGH TEMPERATURE DEFORMATION; INTERGRANULAR GLASS FILM THICKNESS;

SILICON NITRIDE;

EID: 0031100780     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1997.tb02885.x     Document Type: Article

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