Imaging and analysis of sialon interfaces

Materials Science Forum

Volumn 325, Issue , 2000, Pages 231-236

  Falk, L K L ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; IMAGING TECHNIQUES; MICROANALYSIS; MICROSTRUCTURE; NITROGEN; OXYGEN; RARE EARTH ELEMENTS; SAMARIUM COMPOUNDS; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

SIALON;

CERAMIC MATERIALS;

EID: 0033904021     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.4028/www.scientific.net/msf.325-326.231     Document Type: Article

References (11)

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