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Volumn 47, Issue 9, 1999, Pages 2777-2785

Debonding behavior between β-Si3N4 whiskers and oxynitride glasses with or without an epitaxial β-SiAlON interfacial layer

Author keywords

[No Author keywords available]

Indexed keywords

ADDITIVES; ALUMINUM; BOND STRENGTH (CHEMICAL); CALCULATIONS; CRYSTAL WHISKERS; DENSIFICATION; FRACTURE TOUGHNESS; GLASS; OXYGEN; RESIDUAL STRESSES; SILICON COMPOUNDS; SILICON NITRIDE;

EID: 0032628990     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(99)00122-6     Document Type: Article
Times cited : (81)

References (31)
  • 24
    • 85031616979 scopus 로고    scopus 로고
    • Dauskardt, R., Unpublished results
    • Dauskardt, R., Unpublished results
  • 28
    • 85031621966 scopus 로고    scopus 로고
    • Painter, G. S., Unpublished results
    • Painter, G. S., Unpublished results


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.