Digital circuit design trends

IEEE Journal of Solid-State Circuits

Volumn 43, Issue 4, 2008, Pages 757-761

  Horowitz, Mark ^a,b   Stark, Donald ^a,b   Alon, Elad ^a,c  

^a IEEE

^b Stanford University   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; ELECTRIC POWER UTILIZATION; MICROPROCESSOR CHIPS; VLSI CIRCUITS;

CLOCK DISTRIBUTION; NOISE ROBUSTNESS;

DIGITAL CIRCUITS;

EID: 41549139729     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2008.917523     Document Type: Conference Paper

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