On-Die Droop Detector for Analog Sensing of Power Supply Noise

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2003, Pages 193-196

  Muhtaroglu, Ali ^a   Taylor, Greg ^a   Rahal Arabi, Tawfik ^a   Callahan, Kent ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CMOS INTEGRATED CIRCUITS; FREQUENCIES; SPURIOUS SIGNAL NOISE;

POWER SUPPLY NOISE;

MICROPROCESSOR CHIPS;

EID: 0141649444     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. G. Taylor et al. "Reliability and Performance Tradeoffs in the Design of On-Chip Power Delivery and Interconnects", Electrical Performance of Electronic Packaging, pp. 49-52, October 1999.
2. G Bai, et al. "Static Timing Analysis Including Power Supply Noise Effect on Propagation Delay in VLSI Circuits", Design Automation Conference, pp. 295-300, 2001.
3. K.A. Jenkins et al. "Importance of Including Power Supply Noise in Digital Circuit Simulations", Electronics Letters, pp. 1692-1693, 25 Sep 1997.
4. H. Aoki et al. "On-chip Voltage Noise Monitor for Measuring Voltage Bounce in Power Supply Lines Using a Digital Tester", Microelectronic Test Structures, pp. 112-117, 2000.
5. T. Rahal-Arabi et al., "Design and validation of the Pentium® III and Pentium® 4 processors power delivery", 2002 Symposium on VLSI Circuits Digest of Technical Papers, pp. 220-223, 2002.