SCOPUS 정보 검색 플랫폼

MRS Bulletin

Volumn 29, Issue 7, 2004, Pages

Measurements of in-plane material properties with scanning probe microscopy

(2) Carpick, Robert W a Eriksson, Mark A a

a University of Wisconsin Madison (United States)

Author keywords

Atomic force spectroscopy; Mechanical properties; Nanomechanics; Scanning probe microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; DAMPING; ENERGY DISSIPATION; FRICTION; MEASUREMENTS; MECHANICAL PROPERTIES; MOLECULAR STRUCTURE; NANOSTRUCTURED MATERIALS; PHASE SHIFT; SCANNING TUNNELING MICROSCOPY; SHEAR STRESS; STIFFNESS; SURFACE PHENOMENA; TORSIONAL STRESS; VISCOELASTICITY;

NANOMECHANICS; SCANNING PROBE MICROSCOPY; SURFACE STRUCTURES; TORSIONAL RESISTANCE;

SURFACE TOPOGRAPHY;

EID: 4043074892 PISSN: 08837694 EISSN: None Source Type: Journal
DOI: 10.1557/mrs2004.141 Document Type: Review

Times cited : (8)

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