Material anisotropy revealed by phase contrast in intermittent contact atomic force microscopy

Physical Review Letters

Volumn 88, Issue 22, 2002, Pages

  Marcus, Matthew S ^a   Carpick, Robert W ^a   Sasaki, Darryl Y ^a   Eriksson, M A ^a  

^a University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MECHANICAL PROPERTIES; MICROSCOPIC EXAMINATION; MONOLAYERS; NANOSTRUCTURED MATERIALS; OSCILLATIONS; PHASE COMPOSITION; PLASTIC FILMS; STRUCTURE (COMPOSITION); SURFACE PROPERTIES;

IN-PLANE MATERIAL PROPERTIES; INTERMITTENT CONTACT ATOMIC FORCE MICROSCOPY; PHASE CONTRAST; POLYMER MONOLAYERS;

ANISOTROPY;

EID: 0037014093     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (34)