Surface transitions by shear modulation force microscopy

Langmuir

Volumn 17, Issue 19, 2001, Pages 5865-5871

  Pu, Y ^a   Ge, Shouren ^a   Rafailovich, M ^a   Sokolov, K ^a   Duan, Y ^b   Pearce, E ^b   Zaitsev, V ^c   Schwarz, S ^c  

^a Stony Brook University   (United States)

^b POLYTECHNIC UNIVERSITY   (United States)

^c CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SHEAR MODULATION FORCE MICROSCOPY (SMFM);

ATOMIC FORCE MICROSCOPY; COMPUTATIONAL METHODS; ELASTIC MODULI; GLASS TRANSITION; SENSITIVITY ANALYSIS; SURFACE STRUCTURE;

THIN FILMS;

EID: 0035909172     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la001619h     Document Type: Article

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