In-plane contributions to phase contrast in intermittent contact atomic force microscopy

Ultramicroscopy

Volumn 97, Issue 1-4, 2003, Pages 145-150

  Marcus, Matthew S ^a   Eriksson, M A ^a   Sasaki, Darryl Y ^b   Carpick, Robert W ^c  

^a University of Wisconsin Madison   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

AFM

Indexed keywords

MECHANICAL PROPERTIES; MONOLAYERS; NANOSTRUCTURED MATERIALS; POLYMERS;

PHASE CONTRAST;

ATOMIC FORCE MICROSCOPY;

POLYMER;

ANISOTROPY; ARTICLE; ATOMIC FORCE MICROSCOPY; CONTRAST; FILM; MATHEMATICAL MODEL; PHASE CONTRAST MICROSCOPY;

EID: 0038203469     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00039-1     Document Type: Article

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