A new calibration method of the lateral contact stiffness and lateral force using modulated lateral force microscopy

Tribology Letters

Volumn 7, Issue 4, 1999, Pages 213-220

  Pietrement O ^a   Beaudoin, J L ^a   Troyon, M ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

Contact stiffness; Elasticity; Friction; Lateral force modulation; Scanning force microscopy

Indexed keywords

EID: 0041866044     PISSN: 10238883     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1019150226828     Document Type: Article

References (32)

1. C.M. Mate, G.M. McClelland, R. Erlandsson and S. Chiang, Phys. Rev. Lett. 59 (1987) 1942.
2. L.L. Singer and H.M. Pollock, eds., Fundamental of Friction: Macroscopic and Microscopic Processes, NATO ASI series E, Vol. 220 (Kluwer Academic, Dordrecht, 1992).
3. H.J. Guntherödt, D. Anselmetti and E. Meyer, eds., Forces in Scanning Probe Methods, NATO ASI series E, Vol. 286 (Kluwer Academic, Dordrecht, 1994).
4. B. Bhushan, ed., Micro/Nanotribology and its Applications, NATO ASI series E, Vol. 330 (Kluwer Academic, Dordrecht, 1997).
5. T. Göddenheinrich, S. Müller and C. Heiden, Rev. Sci. Instrum. 65 (1994) 2870.
6. J. Colchero, M. Luna and A.M. Baró, Appl. Phys. Lett. 68 (1996) 2896.
7. P.E. Mazeran and J.L. Loubet, Tribol. Lett. 7 (1999) 199.
8. R.W. Carpick, D.F. Ogletree and M. Salmeron, Appl. Phys. Lett. 70 (1997) 1548.
9. M.A. Lantz, S.J. O'Shea, M.E. Welland and K.L. Johnson, Phys. Rev. B 55 (1997) 10776.
10. J. Ruan and B. Bhushan, Trans. ASME 116 (1994) 378.
11. D.F. Ogletree, R.W. Carpick and M. Salmeron, Rev. Sci. Instrum. 67 (1996) 3298.
12. U.D. Schwarz, P. Köster and R. Wiesendanger, Rev. Sci. Instrum. 67 (1996) 2560.
13. E. Liu, B. Blampain and J.P. Celis, Wear 192 (1996) 141.
14. H. Hertz and J. Reine, Angew. Math. 92 (1882) 156.
15. B.V Derjaguin, V.M. Muller and Y.P. Toporov, J. Colloid Interface Sci. 53 (1975) 314.
16. K.L. Jonhson, K. Kendall and A.D. Roberts, Proc. Roy. Soc. London A 324 (1971) 301.
17. D. Maugis, J. Colloid Interface Sci. 150 (1992) 243.
18. R.D. Mindlin, J. Appl. Mech. 16 (1949) 259.
19. M. Troyon, H. Lei, Z. Wang and G. Shang, Micros. Microanal. Microstruct. 8 (1997) 393.
20. B. Cretin and P. Vairac, Appl. Phys. Lett. 71 (1997) 2082.
21. A. Torii, M. Sasaki, K. Hane and S. Okuma, Meas. Sci. Technol. 7 (1996) 179.
22. C.T. Gibson, G.S. Watson and S. Myhra, Nanotechnol. 7 (1996) 259.
23. T.R. Albrecht, S.A. Kamine, T.E. Carver and C.F. Quate, J. Vac. Sci. Technol. A 8 (1990) 3386.
24. Nanosensors, Wacholdenwerg 8, D-71134, Aldingen, Germany.
25. J.E. Sader, Rev. Sci. Instrum. 66 (1995) 4583.
26. J.M. Neumeister and W.A. Ducker, Rev. Sci. Instrum. 65 (1994) 2527.
27. E. Meyer, R. Lüthi, L. Howald, M. Bammerlin, M. Guggisberg, H.J. Güntherodt, L. Scandella, J. Gobrecht, A. Schumacher and R. Prins, in: Physics of Sliding Friction, eds. B.N. J. Persson and E. Tossati (Kluwer Academic, Dordrecht, 1996) pp. 349-367.
28. C.A.J. Putman, M. Igarashi and R. Kaneko, Appl. Phys. Lett. 66 (1995) 3221.
29. M. Labardi, M. Allegrini, M. Salerno, C. Frediani and C. Ascoli, Appl. Phys. A 59 (1994) 3.
30. B. Bhushan and S. Sundararajan, Acta Materiala 46 (1998) 3793.
31. F.P. Bowden and D. Tabor, The Friction and Lubrication of Solids (Clarendon Press, Oxford, 1950).
32. Metafix, ZI de la Roseraie, 80500 Montdidier, France.