Near-field optical microscopy in the presence of an intermediate layer

Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

Volumn 98, Issue 2, 2005, Pages 308-313

  Moiseev, S G ^a   Sukhov, S V ^b  

^a Military Communications University   (Russian Federation)

^b Russian Academy of Sciences   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY VALUE PROBLEMS; GEOMETRY; LIGHT POLARIZATION; LIGHT REFLECTION; PARAMETER ESTIMATION; RESONANCE; THIN FILMS;

EXTERNAL WAVES; SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM); SEMI-INFINITE MEDIUM; THIN SURFACE LAYERS;

OPTICAL MICROSCOPY;

EID: 16644383124     PISSN: 0030400X     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1870075     Document Type: Article

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