Material-specific infrared recognition of single sub-10 nm particles by substrate-enhanced scattering-type near-field microscopy

Nano Letters

Volumn 7, Issue 10, 2007, Pages 3177-3181

  Cvitkovic, A ^a   Ocelic, N ^a   Hillenbrand, R ^a  

^a MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; OPTICAL MATERIALS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PATTERN RECOGNITION; PIXELS;

MATERIA SPECIFIC MAPPING; POLYMER PARTICLES; SEMICONDUCTOR NANOPARTICLES; SPATIAL RESOLUTION;

NANOPARTICLES;

NANOMATERIAL;

ARTICLE; CHEMISTRY; COMPUTER ASSISTED DIAGNOSIS; CONFORMATION; INFRARED RADIATION; LIGHT; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; MICROSCOPY; NANOTECHNOLOGY; PARTICLE SIZE; RADIATION SCATTERING; REFRACTOMETRY; SURFACE PROPERTY; ULTRASTRUCTURE;

IMAGE INTERPRETATION, COMPUTER-ASSISTED; INFRARED RAYS; LIGHT; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROSCOPY; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; REFRACTOMETRY; SCATTERING, RADIATION; SURFACE PROPERTIES;

EID: 36249007087     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl071775+     Document Type: Article

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