Built-in-self-test of FPGAs with provable diagnosabilities and high diagnostic coverage with application to online testing

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 27, Issue 2, 2008, Pages 309-326

  Dutt, Shantanu ^a,b   Verma, Vinay ^c   Suthar, Vishal ^c,d  

^a IEEE

^b University of Illinois at Chicago   (United States)

^c XILINX INC   (United States)

^d UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

Built in self test (BIST); Diagnostic coverage; Field programmable gate arrays (FPGAs); Functional testing; k diagnosability; Online testing; Roving tester (ROTE)

Indexed keywords

BUILT-IN SELF TEST; COMPUTATIONAL METHODS; COMPUTER AIDED DIAGNOSIS; ONLINE SYSTEMS;

DIAGNOSTIC COVERAGE; FAULT DENSITIES; FUNCTIONAL TESTING; K-DIAGNOSABILITY; ROVING TESTER (ROTE);

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 38649111308     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2007.906992     Document Type: Article

References (20)

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