Efficient on-line testing of FPGAs with provable diagnosabilities

Proceedings - Design Automation Conference

Volumn , Issue , 2004, Pages 498-503

  Verma, Vinay ^a   Dutt, Shantanu ^b   Suthar, Vishal ^b  

^a XILINX INC   (United States)

^b UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

Built in self tester (BISTer); Diagnosability; FPGAs; Functional testing; On line testing; Roving tester (ROTE)

Indexed keywords

COMPUTER SIMULATION; FUNCTIONS; MAPPING; NANOTECHNOLOGY; ONLINE SYSTEMS; SCANNING;

BUILT-IN SELF-TESTER (BISTER); DIAGNOSABILITY; FUNCTIONAL TESTING; ON-LINE TESTING; ROVING TESTER (ROTE);

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 4444343543     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/996566.996705     Document Type: Conference Paper

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