Study on the initial growth process of crystalline silicon films on aluminum-coated polyethylene napthalate by Raman spectroscopy

Journal of Crystal Growth

Volumn 308, Issue 2, 2007, Pages 330-333

  Li, Junshuai ^a,b   Wang, Jinxiao ^a   Yin, Min ^a   Gao, Pingqi ^a   He, Deyan ^a   Chen, Qiang ^b   Li, Yali ^b   Shirai, Hajime ^b  

^a LANZHOU UNIVERSITY   (China)

^b SAITAMA UNIVERSITY   (Japan)

Author keywords

A1. Micro structural characterization; A1. Plastic substrates; A1. Raman spectroscopy; A1. Transmission electron microscopy; A3. Chemical vapor deposition processes; B1. Crystalline silicon films

Indexed keywords

ALUMINUM; CHEMICAL VAPOR DEPOSITION; CRYSTALLIZATION; INDUCTIVELY COUPLED PLASMA; POLYETHYLENES; RAMAN SPECTROSCOPY; SILICON COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

ALUMINUM-COATED SUBSTRATES; CRYSTALLINE SILICON FILMS; INITIAL GROWTH PROCESS; MICRO-STRUCTURAL CHARACTERIZATION; PLASTIC SUBSTRATES;

THIN FILMS;

EID: 35348842054     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.08.027     Document Type: Article

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