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Volumn 511-512, Issue , 2006, Pages 603-607

Temperature effect and stress on microcrystalline silicon thin films deposited under high pressure plasma conditions

Author keywords

Amorphous silicon; Film stress; Microcrystalline silicon; Raman spectroscopy

Indexed keywords

AMORPHOUS SILICON; CRYSTALLINE MATERIALS; DEPOSITION; PARTIAL PRESSURE; RAMAN SPECTROSCOPY; THERMODYNAMIC STABILITY;

EID: 33747418484     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.12.121     Document Type: Article
Times cited : (9)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.