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Volumn 511-512, Issue , 2006, Pages 603-607
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Temperature effect and stress on microcrystalline silicon thin films deposited under high pressure plasma conditions
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Author keywords
Amorphous silicon; Film stress; Microcrystalline silicon; Raman spectroscopy
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Indexed keywords
AMORPHOUS SILICON;
CRYSTALLINE MATERIALS;
DEPOSITION;
PARTIAL PRESSURE;
RAMAN SPECTROSCOPY;
THERMODYNAMIC STABILITY;
CRYSTALLINITY;
DEPOSITION RATE;
FILM STRESS;
MICROCRYSTALLINE SILICON;
THIN FILMS;
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EID: 33747418484
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2005.12.121 Document Type: Article |
Times cited : (9)
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References (16)
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