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Volumn 22, Issue 12, 2005, Pages 3130-3132
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Abnormal crystallization of silicon thin films deposited by ICP-CVD
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Author keywords
[No Author keywords available]
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Indexed keywords
INDUCTIVELY COUPLED PLASMA;
SILICON;
SILICON COMPOUNDS;
THIN FILMS;
X RAY DIFFRACTION;
CRISTALLINITY;
EXPERIMENTAL CONDITIONS;
INDUCTIVELY COUPLED PLASMA CHEMICAL VAPOR DEPOSITION;
LOW ELECTRON TEMPERATURE;
LOWS-TEMPERATURES;
ORIENTATION CHANGES;
PREFERRED ORIENTATIONS;
SI-FILMS;
SILICON THIN FILM;
SPATIAL CONFINEMENT;
TEMPERATURE;
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EID: 28744440741
PISSN: 0256307X
EISSN: 17413540
Source Type: Journal
DOI: 10.1088/0256-307X/22/12/041 Document Type: Article |
Times cited : (5)
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References (18)
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