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Volumn 22, Issue 12, 2005, Pages 3130-3132

Abnormal crystallization of silicon thin films deposited by ICP-CVD

Author keywords

[No Author keywords available]

Indexed keywords

INDUCTIVELY COUPLED PLASMA; SILICON; SILICON COMPOUNDS; THIN FILMS; X RAY DIFFRACTION;

EID: 28744440741     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/22/12/041     Document Type: Article
Times cited : (5)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.