Variability in VLSI circuits: Sources and design considerations

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2007, Pages 3215-3218

  Abu Rahma, Mohamed H ^a   Anis, Mohab ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC NETWORK ANALYSIS;

ARCHITECTURE DECISIONS; NANOMETER; PROCESS VARIATIONS; VARIATION-TOLERANT DESIGN;

VLSI CIRCUITS;

EID: 34548838584     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iscas.2007.378156     Document Type: Conference Paper

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