On the need for statistical timing analysis

Proceedings - Design Automation Conference

Volumn , Issue , 2005, Pages 764-765

  Najm, Farid N ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

Statistical timing analysis; Variability

Indexed keywords

DESIGN FOR TESTABILITY; MATHEMATICAL MODELS; PERFORMANCE; STATISTICS;

PROPAGATION DELAY; STATISTICAL TIMING ANALYSIS; VARIABILITY;

TIMING CIRCUITS;

EID: 27944475630     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/dac.2005.193916     Document Type: Conference Paper

References (3)

1. M. Sengupta, et al. Application specific worst case corners using response surfaces and statistical models. In IEEE International Symposium on Quality Electronic Design, pages 351-356, San Jose, CA, March 22-24 2004.
2. S. B. Samaan. The impact of device parameter variations on the frequency and performance of VLSI chips. In IEEE/ACM International Conference on Computer-Aided Design (ICCAD), pages 343-346, San Jose, CA, November 7-11 2004.
3. F. N. Najm and N. Menezes. Statistical timing analysis based on a timing yield model. In ACM/IEEE 41st Design Automation Conference, pages 460-465, San Diego, CA, June 7-11 2004.