Adaptive debug and diagnosis without fault dictionaries

Proceedings - 12th IEEE European Test Symposium, ETS 2007

Volumn , Issue , 2007, Pages 7-12

  Holst, Stefan ^a   Wunderlich, Hans Joachim ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Debug; Diagnosis; Test; VLSI

Indexed keywords

ADAPTIVE SYSTEMS; BENCHMARKING; COMBINATORIAL CIRCUITS; DATA STRUCTURES; FAULT TOLERANCE; STATISTICAL METHODS;

DEFECT MECHANISMS; FAULT MODELS; HIGH RESOLUTION ATPG;

PROGRAM DEBUGGING;

EID: 34548803629     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2007.9     Document Type: Conference Paper

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