Modeling the unknown! Towards model-independent fault and error diagnosis

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 1094-1101

  Boppana, Vamsi ^a   Fujita, Masahiro ^a  

^a FUJITSU LABORATORIES OF AMERICA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SOFTWARE PACKAGE X-LISTS;

ALGORITHMS; COMPUTER AIDED SOFTWARE ENGINEERING; COMPUTER SIMULATION; DIGITAL INTEGRATED CIRCUITS; ERROR ANALYSIS; INFERENCE ENGINES; MATHEMATICAL MODELS;

INTEGRATED CIRCUIT TESTING;

EID: 0032317509     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743310     Document Type: Conference Paper

References (33)