Diagnostic test generation for arbitrary faults

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Bhatti, Naresh K ^a   Blanton, R D ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

ATPG; Fault diagnosis; VLSI testing

Indexed keywords

MATHEMATICAL MODELS; OPTICAL TESTING; PROBLEM SOLVING; PROGRAM DIAGNOSTICS; VLSI CIRCUITS;

DIAGNOSTIC RESOLUTION; DIAGNOSTIC TEST PATTERNS; VLSI TESTING;

FAULT TOLERANCE;

EID: 39749201483     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297647     Document Type: Conference Paper

References (26)