Full fault dictionary storage based on labeled tree encoding

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 174-179

  Boppana, Vamsi ^a   Hartanto, Ismed ^a   Fuchs, W Kent ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY CODES; COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; DATA STORAGE EQUIPMENT; ENCODING (SYMBOLS); ERROR DETECTION; FAILURE ANALYSIS; PERFORMANCE; SEQUENTIAL CIRCUITS; VECTORS;

BINARY STRING CODES; FULL FAULT DICTIONARY STORAGE; LABELED TREE ENCODING;

INTEGRATED CIRCUIT TESTING;

EID: 0029721859     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)