Debug of the CELL processor: Moving the lab into silicon

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Riley, Mack ^a   Chelstrom, Nathan ^a   Genden, Mike ^a   Sawamura, Shoji ^b  

^a IBM   (United States)

^b TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FEATURE EXTRACTION; HIGH SPEED NETWORKS; MULTIPROCESSING SYSTEMS; NETWORK ARCHITECTURE; PROGRAM DEBUGGING; SEMICONDUCTING SILICON;

ASYNCHRONOUS CLOCKS; DEBUG FEATURES; DEBUG PRACTICES; HIGH SPEED DESIGNS;

MICROPROCESSOR CHIPS;

EID: 39749148333     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297671     Document Type: Conference Paper

References (17)