An effective diagnosis method to support yield improvement

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 260-269

  Hora, Camelia ^a   Segers, Rene ^b   Eichenberger, Stefan ^b   Lousberg, Maurice ^c  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b NXP SEMICONDUCTORS   (Netherlands)

^c PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

IN LINE INSPECTION DATA; STATISTICAL FAULT DIAGNOSIS; TEST VECTORS;

CORRELATION METHODS; FAILURE ANALYSIS; INSPECTION; VECTOR QUANTIZATION;

SEMICONDUCTOR DEVICE TESTING;

EID: 0036443180     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

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