Fault equivalence and diagnostic test generation using ATPG

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 5, Issue , 2004, Pages

  Veneris, Andreas ^a   Chang, Robert ^a   Abadir, Magdy S ^b   Amiri, Mandana ^c  

^a UNIVERSITY OF TORONTO   (Canada)

^b MOTOROLA INC   (United States)

^c UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DIAGNOSTIC TEST GENERATION; FAULT DIAGNOSIS; FAULT EQUIVALENCE;

ALGORITHMS; BENCHMARKING; COMPUTER SIMULATION; HARDWARE; INTEGRATED CIRCUIT LAYOUT; SET THEORY; VECTORS;

ELECTRIC FAULT CURRENTS;

EID: 4344646235     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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