Stuck-open fault diagnosis with stuck-at model

Proceedings of the 10th IEEE European Test Symposium, ETS 2005

Volumn 2005, Issue , 2005, Pages 182-187

  Fan, Xinyue ^a   Moore, Will ^a   Hora, Camelia ^b   Gronthoud, Guido ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT DIAGNOSIS TOOLS; STUCK-AT FAULT MODEL;

DIAGNOSIS; LOGIC CIRCUITS; MATHEMATICAL MODELS; TRANSISTORS;

ELECTRIC FAULT CURRENTS;

EID: 33744484315     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2005.35     Document Type: Conference Paper

References (11)

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