Signature analysis for IC diagnosis and failure analysis

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 310-318

  Henderson, Christopher L ^a   Soden, Jerry M ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; FAILURE ANALYSIS;

AUTOMATIC TEST EQUIPMENT (ATE); DEMPSTER SHAFER THEORY;

INTEGRATED CIRCUIT TESTING;

EID: 0031361933     PISSN: 10893539     EISSN: None     Source Type: None    
DOI: 10.1109/TEST.1997.639632     Document Type: Conference Paper

References (11)

1. M. Pore G. Gilfeather L. Levy Risk Assessment in Signature Analysis Int. Symp. Test. and Fail. Anal. 177 182 Int. Symp. Test. and Fail. Anal. 1996-Nov-18-22
2. G, F. Luger W.. Stubblefield Artificial Intelligence and the Design of Expert Systems 314 1989 Benjamin Cummings Publishing Co. Inc.
3. A.P. Dempster A Generalization of Bayesian Inference J. Royal Stat. Soc., Ser. B 30 205 247 1968
4. G. Schafer A Mathematical Theory of Evidence 1976 Princeton University Press N.J., Princeton
5. C.L. Henderson J.M. Soden A Signature Analysis Method for IC Failure Analysis Int. Symp. Test. and Fail. Anal. 189 195 Int. Symp. Test. and Fail. Anal. 1996-Nov-18-22
6. E.I. Cole C.R. Bagnell B.G. Davies A.M. Neacsu W.V. Oxford R.H. Propst Advanced Scanning Electron Microscopy Methods and Applications to Integrated Circuit Failure Analysis Scanning Microscopy 2 1 133 150 1988
7. J.M. Soden R.E. Anderson C.L. Henderson IC Failure Analysis: Magic, Mystery, and Science IEEE Design and Test of Computers July-Sept. 1997
8. C.L. Henderson R.D. Barnard The Advent of Failure Analysis Software Technology Proc. Int. Reliab. Phys. Symp. 325 333 Proc. Int. Reliab. Phys. Symp. 1994
9. R. Aitken A Comparison of Defect Models for Fault Location with IDDQ Measurements Proc. Int. Test Conf. 778 787 Proc. Int. Test Conf. 1992
10. C.F. Hawkins J.M. Soden A.W. Righter J. Ferguson Defect Classes-An Overdue Paradigm for CMOS IC Testing Proc. Int. Test Conf. 413 495 Proc. Int. Test Conf. 1994
11. R. Aitken Finding Defects with Fault Models Proc. Int. Test Conf. 498 505 Proc. Int. Test Conf. 1995